Abstract
A pulsed-beam low energy electron diffraction (LEED) system using the electrical method of detection has been developed, by means of which the reciprocal lattice of the surface structure is obtained as an oscilloscope display. In addition, a precise plot of the intensity of a given diffraction beam as a function of electron energy can be obtained in reduced form as an oscilloscope pattern. The system employs a moving Faraday collector and a rotating crystal to scan the diffraction pattern. The pulsed beam permits measurements by ac techniques.
References
3
Referenced
45
10.1063/1.1725516
/ J. Chem. Phys. (1964)10.1063/1.1721972
/ J. Appl. Phys. (1955)10.1103/PhysRev.75.1902
/ Phys. Rev. (1949)
Dates
Type | When |
---|---|
Created | 20 years, 6 months ago (Feb. 12, 2005, 3:06 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 10, 2024, 4:38 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 11, 2024, 5:37 a.m.) |
Issued | 60 years, 9 months ago (Nov. 1, 1964) |
Published | 60 years, 9 months ago (Nov. 1, 1964) |
Published Print | 60 years, 9 months ago (Nov. 1, 1964) |
@article{Park_1964, title={Pulsed-Beam Low Energy Electron Diffraction System for Rapid Precision Measurements}, volume={35}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1719217}, DOI={10.1063/1.1719217}, number={11}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Park, Robert L. and Farnsworth, H. E.}, year={1964}, month=nov, pages={1592–1596} }