Abstract
An automatic x-ray diffractometer for the investigation of liquid structures has been built. The specimen is held in a horizontal position. The x-ray source and detector rotate in a vertical plane about the center of the specimen face, maintaining equal angles of incidence and diffraction and a constant d(sinθ)/dt. Precise adjustment devices are provided for the parameters of the diffraction geometry and for a crystal monochromator which may be located in either the incident or diffracted beam. A variety of specimen holders may be used, including a high temperature stage which is designed to minimize condensation of vapors evaporating from the specimen.
References
2
Referenced
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10.1063/1.1739869
/ J. Chem. Phys. (1954){'key': '2024020518394989100_r2', 'first-page': '603', 'volume': '15a', 'year': '1960', 'journal-title': 'Z. Naturforsch'}
/ Z. Naturforsch (1960)
Dates
Type | When |
---|---|
Created | 20 years, 6 months ago (Feb. 12, 2005, 12:25 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 2:53 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 10, 2024, 10:21 p.m.) |
Issued | 62 years, 3 months ago (May 1, 1963) |
Published | 62 years, 3 months ago (May 1, 1963) |
Published Print | 62 years, 3 months ago (May 1, 1963) |
@article{Kaplow_1963, title={X-Ray Diffractometer for the Study of Liquid Structures}, volume={34}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1718508}, DOI={10.1063/1.1718508}, number={5}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Kaplow, Roy and Averbach, B. L.}, year={1963}, month=may, pages={579–581} }