Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

A number of experiments directed toward determining the nature and cause of deposits which occur on electron microscope specimens under electron bombardment are described. From these the conclusion is drawn that the material is a result of chemical reaction, occurring at any surface simultaneously bombarded by electrons and organic molecules. The organic vapors are shown to arise in two ways: (1) by diffusion out of the metal walls, gaskets, and greases exposed to the vacuum, (2) by the outgassing of metal parts of the instrument exposed to electron bombardment. To eliminate the effect both sources must be removed.

Bibliography

Hillier, J. (1948). On the Investigation of Specimen Contamination in the Electron Microscope. Journal of Applied Physics, 19(3), 226–230.

Authors 1
  1. James Hillier (first)
References 6 Referenced 70
  1. 10.1063/1.1707491 / J. App. Phys. / Microanalysis by means of electrons (1944)
  2. {'key': '2023062403333273700_r2', 'first-page': '266', 'article-title': 'Further developments on the microanalyzer', 'volume': '16', 'year': '1945', 'journal-title': 'J. App. Phys.'} / J. App. Phys. / Further developments on the microanalyzer (1945)
  3. 10.1063/1.1707628 / J. App. Phys. / On the improvement of resolution in electron diffraction cameras (1946)
  4. 10.1063/1.1697597 / J. App. Phys. (1947)
  5. 10.1063/1.1697852 / J. App. Phys. (1947)
  6. 10.1063/1.1697684 / J. App. Phys. / Single crystal electron diffraction by micro-crystalline materials (1947)
Dates
Type When
Created 20 years, 7 months ago (Jan. 15, 2005, 12:57 p.m.)
Deposited 2 years, 1 month ago (June 24, 2023, 12:06 p.m.)
Indexed 3 weeks, 6 days ago (July 24, 2025, 7:39 a.m.)
Issued 77 years, 5 months ago (March 1, 1948)
Published 77 years, 5 months ago (March 1, 1948)
Published Online 21 years, 3 months ago (April 28, 2004)
Published Print 77 years, 5 months ago (March 1, 1948)
Funders 0

None

@article{Hillier_1948, title={On the Investigation of Specimen Contamination in the Electron Microscope}, volume={19}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1715049}, DOI={10.1063/1.1715049}, number={3}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Hillier, James}, year={1948}, month=mar, pages={226–230} }