DOI: 10.1063/1.1714519. Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory Metals

Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory Metals

10.1063/1.1714519

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

The performance of the helium field-ion microscope depends critically upon accommodating He atoms of 0.15-eV kinetic energy to the specimen tip. The small accommodation coefficient requires the field-trapped He atom to make several hundred contacts with the cold tip surface. The hopping He atoms diffuse preferentially to tip regions where the high local field permits ionization before full accommodation is reached. Improved accommodation is achieved with the provision of an intermediate collision partner in the form of adsorbed neon or, preferably, hydrogen or deuterium. Now a high-resolution He ion image is obtained at 70% of the field used before. As the addition of hydrogen promotes field evaporation, its partial pressure must be carefully controlled to achieve image stability of the nonrefractory metals. Low-field evaporation by the hydrogen reaction permits easy conditioning of the tip surface of the nonrefractory transition metals so that artifacts caused by yielding to He evaporation field stress are no longer a problem. The field evaporation end form obtained with hydrogen added to He more closely approaches the desirable spherical shape of the emitter than does field evaporation in vacuum or in a single imaging gas. As examples, ion images of niobium, nickel, iron, and high carbon steel are shown.

Bibliography

MÃ¼ller, E. W., Nakamura, S., Nishikawa, O., & McLane, S. B. (1965). Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory Metals. Journal of Applied Physics, 36(8), 2496â2503.

Authors 4

E. W. Müller (first)
S. Nakamura (additional)
O. Nishikawa (additional)
S. B. McLane (additional)

References 31 Referenced 108

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{'key': '2024020208265426200_r3', 'first-page': '621', 'volume': '102', 'year': '1956', 'journal-title': 'Phys. Rev.'} / Phys. Rev. (1956)
10.1063/1.1722406 / J. Appl. Phys. (1956)
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{'key': '2024020208265426200_r5', 'first-page': '145', 'volume': '44', 'year': '1914', 'journal-title': 'Ann. Physik'} / Ann. Physik (1914)
10.1016/0022-3697(62)90173-7 / J. Phys. Chem. Solids (1962)
{'key': '2024020208265426200_r7', 'first-page': '215', 'volume': '3', 'year': '1964', 'journal-title': 'J. Mecan.'} / J. Mecan. (1964)
10.1063/1.1742136 / J. Chem. Phys. (1955)
{'key': '2024020208265426200_r9'}
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{'key': '2024020208265426200_r11'}
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{'key': '2024020208265426200_r14'}
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{'key': '2024020208265426200_r17'}
{'key': '2024020208265426200_r18', 'first-page': '161', 'volume': '1', 'year': '1964', 'journal-title': 'Proc. III European Regional Conf. Electron Microscopy, Prague'} / Proc. III European Regional Conf. Electron Microscopy, Prague (1964)
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10.1016/0039-6028(64)90090-1 / Surface Sci. (1964)
{'key': '2024020208265426200_r27'}
{'key': '2024020208265426200_r28', 'first-page': '104', 'volume': '9', 'year': '1964', 'journal-title': 'Bull. Am. Phys. Soc.'} / Bull. Am. Phys. Soc. (1964)
{'key': '2024020208265426200_r29'}
{'key': '2024020208265426200_r30'}

Dates

Type	When
Created	20 years, 4 months ago (April 22, 2005, 12:39 p.m.)
Deposited	1 year, 7 months ago (Feb. 2, 2024, 4:48 a.m.)
Indexed	1 month, 3 weeks ago (July 14, 2025, 11:40 p.m.)
Issued	60 years, 1 month ago (Aug. 1, 1965)
Published	60 years, 1 month ago (Aug. 1, 1965)
Published Print	60 years, 1 month ago (Aug. 1, 1965)

Funders 0

None

BibTeX

@article{M_ller_1965, title={Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory Metals}, volume={36}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1714519}, DOI={10.1063/1.1714519}, number={8}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Müller, E. W. and Nakamura, S. and Nishikawa, O. and McLane, S. B.}, year={1965}, month=aug, pages={2496–2503} }

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