Crossref
journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract
A decrease in the cathodoluminescence produced in GaAs by a scanning electron probe has been observed when the probe is close to a p-n junction. The decreased intensity is shown to result from the drift of excess carriers across the junction. Measurements of the short-circuit current of the diode confirm this interpretation and provide a means of estimating minority carrier diffusion lengths.
References
4
Referenced
114
10.1063/1.1702876
/ J. Appl. Phys. (1964){'key': '2024020208092986800_r2'}
{'key': '2024020208092986800_r3'}
{'key': '2024020208092986800_r4'}
Dates
Type | When |
---|---|
Created | 20 years, 4 months ago (April 22, 2005, 12:39 p.m.) |
Deposited | 1 year, 7 months ago (Feb. 2, 2024, 4:38 a.m.) |
Indexed | 2 months, 1 week ago (June 25, 2025, 7:05 p.m.) |
Issued | 60 years, 5 months ago (April 1, 1965) |
Published | 60 years, 5 months ago (April 1, 1965) |
Published Print | 60 years, 5 months ago (April 1, 1965) |
@article{Wittry_1965, title={Cathodoluminescence at p-n Junctions in GaAs}, volume={36}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1714315}, DOI={10.1063/1.1714315}, number={4}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Wittry, David B. and Kyser, David F.}, year={1965}, month=apr, pages={1387–1389} }