DOI: 10.1063/1.1713221. Metal-Semiconductor Barrier-Height Measurement by the Differential Capacitance Method

Metal-Semiconductor Barrier-Height Measurement by the Differential Capacitance Method—Degenerate One-Carrier System

10.1063/1.1713221

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

An expression is derived for the differential capacitance of a metal contact to a semiconductor in which the bulk free carrier density is degenerate or near degenerate. A significant correction to the nondegenerate theory may be required for accurate measurement of the barrier height.

Bibliography

Goodman, A. M., & Perkins, D. M. (1964). Metal-Semiconductor Barrier-Height Measurement by the Differential Capacitance MethodâDegenerate One-Carrier System. Journal of Applied Physics, 35(11), 3351â3353.

Authors 2

Alvin M. Goodman (first)
David M. Perkins (additional)

References 14 Referenced 20

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{'key': '2024020207525532200_r2', 'first-page': '641', 'volume': '32', 'year': '1931', 'journal-title': 'Phys. Z.'} / Phys. Z. (1931)
10.1007/BF01329843 / Z. Phys. (1942)
10.1002/j.1538-7305.1960.tb03935.x / Bell. System Tech. J. (1960)
10.1016/0038-1101(62)90013-8 / Solid State Electron. (1962)
10.1063/1.1702608 / J. Appl. Phys. (1963)
10.1063/1.1729121 / J. Appl. Phys. (1963)
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{'key': '2024020207525532200_r11', 'first-page': '67', 'volume': 'A237', 'year': '1938', 'journal-title': 'Trans. Roy. Soc. (London)'} / Trans. Roy. Soc. (London) (1938)
10.1063/1.1723358 / J. Appl. Phys. (1958)
{'key': '2024020207525532200_r13'}
10.1002/j.1538-7305.1949.tb03644.x / Bell System Tech. J. (1949)

Dates

Type	When
Created	20 years, 4 months ago (April 22, 2005, 12:38 p.m.)
Deposited	1 year, 6 months ago (Feb. 2, 2024, 4:15 a.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 8:04 a.m.)
Issued	60 years, 9 months ago (Nov. 1, 1964)
Published	60 years, 9 months ago (Nov. 1, 1964)
Published Print	60 years, 9 months ago (Nov. 1, 1964)

Funders 0

None

BibTeX

@article{Goodman_1964, title={Metal-Semiconductor Barrier-Height Measurement by the Differential Capacitance Method—Degenerate One-Carrier System}, volume={35}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1713221}, DOI={10.1063/1.1713221}, number={11}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Goodman, Alvin M. and Perkins, David M.}, year={1964}, month=nov, pages={3351–3353} }

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