DOI: 10.1063/1.1710223. Electron Microprobe Analysis of the Mixing Profile of Ge

Electron Microprobe Analysis of the Mixing Profile of Ge–Si Alloyed Heterojunctions

10.1063/1.1710223

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Bibliography

Reenstra, A. L., & Thompson, H. W. (1967). Electron Microprobe Analysis of the Mixing Profile of GeâSi Alloyed Heterojunctions. Journal of Applied Physics, 38(9), 3798â3799.

Authors 2

A. L. Reenstra (first)
H. W. Thompson (additional)

References 4 Referenced 4

{'key': '2024020209583017700_r1'}
10.1063/1.1714553 / J. Appl. Phys. (1965)
{'key': '2024020209583017700_r3', 'first-page': '11', 'volume': '8', 'year': '1963', 'journal-title': 'Soviet Phys.-Cryst.'} / Soviet Phys.-Cryst. (1963)
{'key': '2024020209583017700_r4'}

Dates

Type	When
Created	20 years, 7 months ago (Jan. 15, 2005, 10:15 a.m.)
Deposited	1 year, 7 months ago (Feb. 2, 2024, 5:47 a.m.)
Indexed	1 year, 7 months ago (Feb. 2, 2024, 6:23 a.m.)
Issued	58 years, 1 month ago (Aug. 1, 1967)
Published	58 years, 1 month ago (Aug. 1, 1967)
Published Print	58 years, 1 month ago (Aug. 1, 1967)

Funders 0

None

BibTeX

@article{Reenstra_1967, title={Electron Microprobe Analysis of the Mixing Profile of Ge–Si Alloyed Heterojunctions}, volume={38}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1710223}, DOI={10.1063/1.1710223}, number={9}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Reenstra, A. L. and Thompson, H. W.}, year={1967}, month=aug, pages={3798–3799} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        2
      ]
    ],
    "date-time": "2024-02-02T11:23:14Z",
    "timestamp": 1706872994722
  },
  "reference-count": 4,
  "publisher": "AIP Publishing",
  "issue": "9",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1967,
        8,
        1
      ]
    ]
  },
  "DOI": "10.1063/1.1710223",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2005,
        1,
        15
      ]
    ],
    "date-time": "2005-01-15T15:15:01Z",
    "timestamp": 1105802101000
  },
  "page": "3798-3799",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 4,
  "title": "Electron Microprobe Analysis of the Mixing Profile of Ge\u2013Si Alloyed Heterojunctions",
  "prefix": "10.1063",
  "volume": "38",
  "author": [
    {
      "given": "A. L.",
      "family": "Reenstra",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Purdue University, Lafayette, Indiana"
        }
      ]
    },
    {
      "suffix": "Jr.",
      "given": "H. W.",
      "family": "Thompson",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Purdue University, Lafayette, Indiana"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020209583017700_r1"
    },
    {
      "key": "2024020209583017700_r2",
      "doi-asserted-by": "crossref",
      "first-page": "2652",
      "DOI": "10.1063/1.1714553",
      "volume": "36",
      "year": "1965",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020209583017700_r3",
      "first-page": "11",
      "volume": "8",
      "year": "1963",
      "journal-title": "Soviet Phys.-Cryst."
    },
    {
      "key": "2024020209583017700_r4"
    }
  ],
  "container-title": "Journal of Applied Physics",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/38/9/3798/18342906/3798_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/jap/article-pdf/38/9/3798/18342906/3798_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        2
      ]
    ],
    "date-time": "2024-02-02T10:47:24Z",
    "timestamp": 1706870844000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/jap/article/38/9/3798/4087/Electron-Microprobe-Analysis-of-the-Mixing-Profile"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1967,
        8,
        1
      ]
    ]
  },
  "references-count": 4,
  "journal-issue": {
    "issue": "9",
    "published-print": {
      "date-parts": [
        [
          1967,
          8,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1710223",
  "relation": {},
  "ISSN": [
    "0021-8979",
    "1089-7550"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1967,
        8
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1967,
        8,
        1
      ]
    ]
  }
}