Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

The transmittance and reflectance of CuO0.67 and CuO films ranging in thickness from 392 to 2335 Å have been measured in the wavelength region of 400 to 800 mμ. These data were used to obtain the wavelength dependence of the optical constants of these materials. Differences between the optical properties of CuO0.67 and Cu2O are attributed to differences in stoichiometry rather than to size effects. A method for measuring absolute reflectance is described.

Bibliography

Wieder, H., & Czanderna, A. W. (1966). Optical Properties of Copper Oxide Films. Journal of Applied Physics, 37(1), 184–187.

Authors 2
  1. Harold Wieder (first)
  2. A. W. Czanderna (additional)
References 12 Referenced 79
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Dates
Type When
Created 20 years, 4 months ago (April 22, 2005, 1:06 p.m.)
Deposited 1 year, 6 months ago (Feb. 2, 2024, 4:56 a.m.)
Indexed 2 months ago (June 25, 2025, 4:47 p.m.)
Issued 59 years, 7 months ago (Jan. 1, 1966)
Published 59 years, 7 months ago (Jan. 1, 1966)
Published Print 59 years, 7 months ago (Jan. 1, 1966)
Funders 0

None

@article{Wieder_1966, title={Optical Properties of Copper Oxide Films}, volume={37}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1707803}, DOI={10.1063/1.1707803}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Wieder, Harold and Czanderna, A. W.}, year={1966}, month=jan, pages={184–187} }