Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

An electron optical system is described in which it is possible to obtain (1) high resolution electron diffraction patterns, (2) shadow electron microscope images, and (3) electron diffraction patterns of selected variable areas of the specimen. The change in mode of operation of the system is accomplished by electrical adjustments without changing the specimen position in any way. A number of phenomena related to the attainment of high resolution diffraction patterns are described. Pertinent details of the experimental apparatus are discussed and some representative results are shown.

Bibliography

Hillier, J., & Baker, R. F. (1946). On the Improvement of Resolution in Electron Diffraction Cameras. Journal of Applied Physics, 17(1), 12–22.

Authors 2
  1. James Hillier (first)
  2. R. F. Baker (additional)
References 4 Referenced 38
  1. 10.1063/1.1714911 / J. App. Phys. (1942)
  2. {'key': '2024020123551652300_r2', 'first-page': '399', 'volume': 'A141', 'year': '1933', 'journal-title': 'Proc. Roy. Soc.'} / Proc. Roy. Soc. (1933)
  3. 10.1039/tf9353101051 / Trans. Faraday Soc. (1935)
  4. 10.1007/BFb0112078 / Ergeb. d. exakt. Naturwiss. (1937)
Dates
Type When
Created 20 years, 7 months ago (Jan. 15, 2005, 12:46 p.m.)
Deposited 1 year, 6 months ago (Feb. 1, 2024, 7:25 p.m.)
Indexed 1 year, 6 months ago (Feb. 11, 2024, 6:22 a.m.)
Issued 79 years, 7 months ago (Jan. 1, 1946)
Published 79 years, 7 months ago (Jan. 1, 1946)
Published Print 79 years, 7 months ago (Jan. 1, 1946)
Funders 0

None

@article{Hillier_1946, title={On the Improvement of Resolution in Electron Diffraction Cameras}, volume={17}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1707628}, DOI={10.1063/1.1707628}, number={1}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Hillier, James and Baker, R. F.}, year={1946}, month=jan, pages={12–22} }