Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

Dark-field images in the electron microscope were studied by means of an objective aperture system fixed to the object rather than to the objective lens. The resolution in images produced by the diffusely scattered component is in the range 100 to 200A, but the resolution in images produced by Bragg reflections approaches that obtainable in bright-field operation. A resolution of about 50A was obtained with test objects consisting of evaporated films containing small crystallites, but it is estimated that crystallites having dimensions down to about 20A can be recorded with conditions prevailing in this work. Substances studied in dark-field include evaporated films of metals and compounds and finely divided substances. It is concluded that the dark-field method is of value for studying the size, location, and other characteristics of crystalline components in a specimen. Some of the theoretical factors influencing resolution in dark-field are discussed.

Bibliography

Hall, C. E. (1948). Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-Field. Journal of Applied Physics, 19(2), 198–212.

Authors 1
  1. C. E. Hall (first)
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Dates
Type When
Created 20 years, 7 months ago (Jan. 15, 2005, 12:57 p.m.)
Deposited 2 years, 1 month ago (June 24, 2023, 11:54 a.m.)
Indexed 3 days ago (Aug. 19, 2025, 6:09 a.m.)
Issued 77 years, 6 months ago (Feb. 1, 1948)
Published 77 years, 6 months ago (Feb. 1, 1948)
Published Online 21 years, 3 months ago (April 28, 2004)
Published Print 77 years, 6 months ago (Feb. 1, 1948)
Funders 0

None

@article{Hall_1948, title={Dark-Field Electron Microscopy. I. Studies of Crystalline Substances in Dark-Field}, volume={19}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1698396}, DOI={10.1063/1.1698396}, number={2}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Hall, C. E.}, year={1948}, month=feb, pages={198–212} }