DOI: 10.1063/1.1690878. Crossover between extrinsic and intrinsic dielectric loss mechanisms in SrTiO3 thin films at microwave frequencies

Crossover between extrinsic and intrinsic dielectric loss mechanisms in SrTiO3 thin films at microwave frequencies

10.1063/1.1690878

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The dc bias field dependence of the dielectric loss in SrTiO3 thin films deposited onto MgO substrate is investigated. The experimental data obtained at different frequencies of the ac field (8 and 16 GHz) from differently processed films (as deposited and oxygen annealed) strongly suggest the occurrence of a crossover in the dominant loss mechanism. The crossover is driven by the dc bias field: at weak fields the loss is governed by an extrinsic mechanism(s) whereas, at higher fields, the contribution of an intrinsic mechanism (dc field-induced quasi-Debye loss) becomes predominant.

Bibliography

Astafiev, K. F., Sherman, V. O., Tagantsev, A. K., Setter, N., Kaydanova, T., & Ginley, D. S. (2004). Crossover between extrinsic and intrinsic dielectric loss mechanisms in SrTiO3 thin films at microwave frequencies. Applied Physics Letters, 84(13), 2385â2387.

Authors 6

K. F. Astafiev (first)
V. O. Sherman (additional)
A. K. Tagantsev (additional)
N. Setter (additional)
T. Kaydanova (additional)
D. S. Ginley (additional)

References 15 Referenced 12

10.1023/A:1007797131173 / J. Supercond. (1999)
10.1109/7260.959311 / IEEE Microw. Wirel. Compon. Lett. (2001)
{'key': '2024020402464362700_r3', 'first-page': '221', 'volume': '603', 'year': '2000', 'journal-title': 'Mater. Res. Soc. Symp. Proc.'} / Mater. Res. Soc. Symp. Proc. (2000)
10.1063/1.126212 / Appl. Phys. Lett. (2000)
10.1080/10584580390261134 / Integr. Ferroelectr. (2003)
10.1080/713718369 / Integr. Ferroelectr. (2002)
10.1016/0167-9317(95)00156-5 / Microelectron. Eng. (1995)
10.1049/el:19950427 / Electron. Lett. (1995)
{'key': '2024020402464362700_r9', 'first-page': '765', 'volume': '22', 'year': '1998', 'journal-title': 'Integr. Ferroelectr.'} / Integr. Ferroelectr. (1998)
{'key': '2024020402464362700_r10', 'first-page': '1201', 'volume': '39', 'year': '2001', 'journal-title': 'Integr. Ferroelectr.'} / Integr. Ferroelectr. (2001)
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{'key': '2024020402464362700_r12', 'first-page': '667', 'volume': '372', 'year': '2002', 'journal-title': 'Physica C'} / Physica C (2002)
10.1080/00018739100101552 / Adv. Phys. (1991)
10.1063/1.120796 / Appl. Phys. Lett. (1998)
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Dates

Type	When
Created	21 years, 5 months ago (March 20, 2004, 4:30 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 9:46 p.m.)
Indexed	1 year, 6 months ago (Feb. 3, 2024, 10:10 p.m.)
Issued	21 years, 4 months ago (March 29, 2004)
Published	21 years, 4 months ago (March 29, 2004)
Published Print	21 years, 4 months ago (March 29, 2004)

Funders 0

None

BibTeX

@article{Astafiev_2004, title={Crossover between extrinsic and intrinsic dielectric loss mechanisms in SrTiO3 thin films at microwave frequencies}, volume={84}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1690878}, DOI={10.1063/1.1690878}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Astafiev, K. F. and Sherman, V. O. and Tagantsev, A. K. and Setter, N. and Kaydanova, T. and Ginley, D. S.}, year={2004}, month=mar, pages={2385–2387} }

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