Crossref journal-article
AIP Publishing
Review of Scientific Instruments (317)
Abstract

An analysis is given of the Kelvin method employing a variable shield potential, which takes nonuniformity of the surfaces into account. The influence of stray capacitance can be determined and eliminated by measuring as a function of spacing between the Kelvin electrodes for different values of the shield potential. These extended Kelvin measurements make it also possible to detect nonuniformity of the sample electrode and to eliminate its influence in certain cases, as is demonstrated by measurements on a vacuum cleaved TiO2 (rutile) (110) surface.

Bibliography

de Boer, J. S. W., Krusemeyer, H. J., & Jaspers, N. C. B. (1973). Analysis and Improvement of the Kelvin Method for Measuring Differences in Work Function. Review of Scientific Instruments, 44(8), 1003–1008.

Authors 3
  1. J. S. W. de Boer (first)
  2. H. J. Krusemeyer (additional)
  3. N. C. Burhoven Jaspers (additional)
References 21 Referenced 46
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Dates
Type When
Created 21 years, 6 months ago (Feb. 10, 2004, 1:02 p.m.)
Deposited 1 year, 6 months ago (Feb. 10, 2024, 4:28 p.m.)
Indexed 2 months ago (June 27, 2025, 8:41 p.m.)
Issued 52 years ago (Aug. 1, 1973)
Published 52 years ago (Aug. 1, 1973)
Published Print 52 years ago (Aug. 1, 1973)
Funders 0

None

@article{de_Boer_1973, title={Analysis and Improvement of the Kelvin Method for Measuring Differences in Work Function}, volume={44}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1686287}, DOI={10.1063/1.1686287}, number={8}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={de Boer, J. S. W. and Krusemeyer, H. J. and Jaspers, N. C. Burhoven}, year={1973}, month=aug, pages={1003–1008} }