DOI: 10.1063/1.1683244. Ultrahigh Vacuum Electron Microscope

10.1063/1.1683244

Crossref journal-article

AIP Publishing

Review of Scientific Instruments (317)

Abstract

A Hitachi HU-11B electron microscope has been modified for ultrahigh vacuum operation. Differential sputter ion pumps are used to evacuate the entire microscope column, which was extensively modified to be compatible with the high vacuum, low contamination environment. Excellent beam stability and resolution have been observed with column pressures as low as 5×10−8 Torr, but the image intensifier has proved unsatisfactory for high resolution readout.

Bibliography

Braski, D. N., Gibson, J. R., & Kobisk, E. H. (1968). Ultrahigh Vacuum Electron Microscope. Review of Scientific Instruments, 39(12), 1806â1811.

Authors 3

D. N. Braski (first)
J. R. Gibson (additional)
E. H. Kobisk (additional)

References 9 Referenced 8

10.1088/0508-3443/4/4/302 / Brit. J. Appl. Phys. (1953)
{'key': '2024020615064244200_r2'}
10.1016/0022-3115(64)90118-7 / J. Nucl. Mater. (1964)
10.1080/14786436608218996 / Phil. Mag. (1966)
{'key': '2024020615064244200_r5'}
{'key': '2024020615064244200_r6'}
{'key': '2024020615064244200_r7'}
{'key': '2024020615064244200_r8'}
{'key': '2024020615064244200_r9'}

Dates

Type	When
Created	21 years, 6 months ago (Feb. 10, 2004, 12:46 p.m.)
Deposited	1 year, 6 months ago (Feb. 6, 2024, 10:20 a.m.)
Indexed	1 year, 6 months ago (Feb. 10, 2024, 6:06 p.m.)
Issued	56 years, 8 months ago (Dec. 1, 1968)
Published	56 years, 8 months ago (Dec. 1, 1968)
Published Print	56 years, 8 months ago (Dec. 1, 1968)

Funders 0

None

BibTeX

@article{Braski_1968, title={Ultrahigh Vacuum Electron Microscope}, volume={39}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1683244}, DOI={10.1063/1.1683244}, number={12}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Braski, D. N. and Gibson, J. R. and Kobisk, E. H.}, year={1968}, month=dec, pages={1806–1811} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        10
      ]
    ],
    "date-time": "2024-02-10T23:06:06Z",
    "timestamp": 1707606366724
  },
  "reference-count": 9,
  "publisher": "AIP Publishing",
  "issue": "12",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1968,
        12,
        1
      ]
    ]
  },
  "abstract": "<jats:p>A Hitachi HU-11B electron microscope has been modified for ultrahigh vacuum operation. Differential sputter ion pumps are used to evacuate the entire microscope column, which was extensively modified to be compatible with the high vacuum, low contamination environment. Excellent beam stability and resolution have been observed with column pressures as low as 5\u00d710\u22128 Torr, but the image intensifier has proved unsatisfactory for high resolution readout.</jats:p>",
  "DOI": "10.1063/1.1683244",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        2,
        10
      ]
    ],
    "date-time": "2004-02-10T17:46:03Z",
    "timestamp": 1076435163000
  },
  "page": "1806-1811",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 8,
  "title": "Ultrahigh Vacuum Electron Microscope",
  "prefix": "10.1063",
  "volume": "39",
  "author": [
    {
      "given": "D. N.",
      "family": "Braski",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830"
        }
      ]
    },
    {
      "given": "J. R.",
      "family": "Gibson",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830"
        }
      ]
    },
    {
      "given": "E. H.",
      "family": "Kobisk",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020615064244200_r1",
      "doi-asserted-by": "crossref",
      "first-page": "101",
      "DOI": "10.1088/0508-3443/4/4/302",
      "volume": "4",
      "year": "1953",
      "journal-title": "Brit. J. Appl. Phys."
    },
    {
      "key": "2024020615064244200_r2"
    },
    {
      "key": "2024020615064244200_r3",
      "doi-asserted-by": "crossref",
      "first-page": "32",
      "DOI": "10.1016/0022-3115(64)90118-7",
      "volume": "11",
      "year": "1964",
      "journal-title": "J. Nucl. Mater."
    },
    {
      "key": "2024020615064244200_r4",
      "doi-asserted-by": "crossref",
      "first-page": "135",
      "DOI": "10.1080/14786436608218996",
      "volume": "14",
      "year": "1966",
      "journal-title": "Phil. Mag."
    },
    {
      "key": "2024020615064244200_r5"
    },
    {
      "key": "2024020615064244200_r6"
    },
    {
      "key": "2024020615064244200_r7"
    },
    {
      "key": "2024020615064244200_r8"
    },
    {
      "key": "2024020615064244200_r9"
    }
  ],
  "container-title": "Review of Scientific Instruments",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/39/12/1806/19223749/1806_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/rsi/article-pdf/39/12/1806/19223749/1806_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        6
      ]
    ],
    "date-time": "2024-02-06T15:20:43Z",
    "timestamp": 1707232843000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/rsi/article/39/12/1806/303969/Ultrahigh-Vacuum-Electron-Microscope"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1968,
        12,
        1
      ]
    ]
  },
  "references-count": 9,
  "journal-issue": {
    "issue": "12",
    "published-print": {
      "date-parts": [
        [
          1968,
          12,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1683244",
  "relation": {},
  "ISSN": [
    "0034-6748",
    "1089-7623"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1968,
        12
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1968,
        12,
        1
      ]
    ]
  }
}