DOI: 10.1063/1.1655992. Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements

Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements

10.1063/1.1655992

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

A rapid and convenient method is described for the accurate determination of the thickness of carbon films from their optical density. A linear relationship was found between optical density and film thickness. The optical-density-thickness curve was calibrated by direct measurement of the thickness of transverse sections of carbon films embedded in epoxy resin. The method can probably be extended to thin films of soft metals and other inorganic films having significant optical density and capable of being sectioned with a diamond knife.

Bibliography

Moretz, R. C., Johnson, H. M., & Parsons, D. F. (1968). Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements. Journal of Applied Physics, 39(12), 5421â5424.

Authors 3

R. C. Moretz (first)
H. M. Johnson (additional)
D. F. Parsons (additional)

References 16 Referenced 27

{'key': '2024020200422180300_r1'}
10.1088/0950-7671/36/4/305 / J. Sci. Instr. (1959)
{'key': '2024020200422180300_r3'}
{'key': '2024020200422180300_r4'}
10.1083/jcb.8.1.1 / J. Biophys. Biochem. Cytol. (1960)
10.1063/1.1755124 / Appl. Phys. Letters (1967)
{'key': '2024020200422180300_r7'}
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{'key': '2024020200422180300_r10', 'first-page': '109', 'volume': '9', 'year': '1961', 'journal-title': 'J. Biophys. Biochem. Cytol.'} / J. Biophys. Biochem. Cytol. (1961)
10.1063/1.1697554 / J. Appl. Phys. (1947)
{'key': '2024020200422180300_r12'}
{'key': '2024020200422180300_r13', 'first-page': '65', 'volume': '6', 'year': '1958', 'journal-title': 'J. Electronmicroscopy'} / J. Electronmicroscopy (1958)
10.1620/tjem.82.201 / Tohoku J. Exp. Med. (1964)
10.1063/1.1707999 / J. Appl. Phys. (1966)
{'key': '2024020200422180300_r16', 'first-page': '127', 'volume': '13', 'year': '1960', 'journal-title': 'Melhoramento'} / Melhoramento (1960)

Dates

Type	When
Created	21 years, 6 months ago (Feb. 9, 2004, 11:55 a.m.)
Deposited	1 year, 6 months ago (Feb. 1, 2024, 7:52 p.m.)
Indexed	1 year, 3 months ago (May 9, 2024, 12:34 a.m.)
Issued	56 years, 9 months ago (Nov. 1, 1968)
Published	56 years, 9 months ago (Nov. 1, 1968)
Published Print	56 years, 9 months ago (Nov. 1, 1968)

Funders 0

None

BibTeX

@article{Moretz_1968, title={Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density Measurements}, volume={39}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1655992}, DOI={10.1063/1.1655992}, number={12}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Moretz, R. C. and Johnson, H. M. and Parsons, D. F.}, year={1968}, month=nov, pages={5421–5424} }

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