DOI: 10.1063/1.1655695. Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy

Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy

10.1063/1.1655695

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report on the ferroelectric domain evolution as a function of the depth of the surface of 100 μm thick bulk Pb(Zr,Ti)O3 (PZT) doped with 2% Nb. Ferroelectric domain imaging (FDI) was performed by piezoelectric detection assisted by atomic force microscopy (AFM). The depth evolution of the polarization orientation was obtained by repeated surface chemical etching followed by FDI. It was observed that backswitching mainly occurred close to 90° domain and grain boundaries. The depth of these domains was estimated to be about 500 nm. This indicates that nonpenetrating domains of opposite polarity can retain their polarization vector near the surface region without the help of a top electrode interface. It also supports the idea that they act as preferential nucleation sites for polarization reversal. We suggest that AFM FDI combined with proper etching methods could be used to construct a three-dimensional image of the whole domain structure by stacking two-dimensional images layer by layer.

Bibliography

Hong, S., Ecabart, B., Colla, E. L., & Setter, N. (2004). Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy. Applied Physics Letters, 84(13), 2382â2384.

Authors 4

Seungbum Hong (first)
Bastien Ecabart (additional)
Enrico L. Colla (additional)
Nava Setter (additional)

References 17 Referenced 32

10.1088/0957-4484/10/4/308 / Nanotechnology (1999)
10.1063/1.121083 / Appl. Phys. Lett. (1998)
10.1103/PhysRevB.61.14440 / Phys. Rev. B (2000)
10.1063/1.370774 / J. Appl. Phys. (1999)
10.1146/annurev.matsci.28.1.101 / Annu. Rev. Mater. Sci. (1998)
10.1063/1.1331654 / J. Appl. Phys. (2001)
10.1116/1.1364697 / J. Vac. Sci. Technol. B (2001)
{'key': '2024020402443640900_r8'}
{'key': '2024020402443640900_r9'}
{'key': '2024020402443640900_r10'}
10.1063/1.126954 / Appl. Phys. Lett. (2000)
10.1063/1.1322051 / Appl. Phys. Lett. (2000)
10.1063/1.120369 / Appl. Phys. Lett. (1997)
10.1063/1.366782 / J. Appl. Phys. (1998)
10.1063/1.117031 / Appl. Phys. Lett. (1996)
{'key': '2024020402443640900_r16'}
10.1146/annurev.matsci.30.1.263 / Annu. Rev. Mater. Sci. (2000)

Dates

Type	When
Created	21 years, 5 months ago (March 20, 2004, 4:30 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 9:45 p.m.)
Indexed	2 months, 4 weeks ago (May 25, 2025, 8:42 a.m.)
Issued	21 years, 4 months ago (March 29, 2004)
Published	21 years, 4 months ago (March 29, 2004)
Published Print	21 years, 4 months ago (March 29, 2004)

Funders 0

None

BibTeX

@article{Hong_2004, title={Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy}, volume={84}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1655695}, DOI={10.1063/1.1655695}, number={13}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Hong, Seungbum and Ecabart, Bastien and Colla, Enrico L. and Setter, Nava}, year={2004}, month=mar, pages={2382–2384} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2025,
        5,
        25
      ]
    ],
    "date-time": "2025-05-25T12:42:16Z",
    "timestamp": 1748176936444
  },
  "reference-count": 17,
  "publisher": "AIP Publishing",
  "issue": "13",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2004,
        3,
        29
      ]
    ]
  },
  "abstract": "<jats:p>We report on the ferroelectric domain evolution as a function of the depth of the surface of 100 \u03bcm thick bulk Pb(Zr,Ti)O3 (PZT) doped with 2% Nb. Ferroelectric domain imaging (FDI) was performed by piezoelectric detection assisted by atomic force microscopy (AFM). The depth evolution of the polarization orientation was obtained by repeated surface chemical etching followed by FDI. It was observed that backswitching mainly occurred close to 90\u00b0 domain and grain boundaries. The depth of these domains was estimated to be about 500 nm. This indicates that nonpenetrating domains of opposite polarity can retain their polarization vector near the surface region without the help of a top electrode interface. It also supports the idea that they act as preferential nucleation sites for polarization reversal. We suggest that AFM FDI combined with proper etching methods could be used to construct a three-dimensional image of the whole domain structure by stacking two-dimensional images layer by layer.</jats:p>",
  "DOI": "10.1063/1.1655695",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        3,
        20
      ]
    ],
    "date-time": "2004-03-20T09:30:06Z",
    "timestamp": 1079775006000
  },
  "page": "2382-2384",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 32,
  "title": "Three-dimensional ferroelectric domain imaging of bulk Pb(Zr,Ti)O3 by atomic force microscopy",
  "prefix": "10.1063",
  "volume": "84",
  "author": [
    {
      "given": "Seungbum",
      "family": "Hong",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Ceramic Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland"
        }
      ]
    },
    {
      "given": "Bastien",
      "family": "Ecabart",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Ceramic Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland"
        }
      ]
    },
    {
      "given": "Enrico L.",
      "family": "Colla",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Ceramic Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland"
        }
      ]
    },
    {
      "given": "Nava",
      "family": "Setter",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Ceramic Laboratory, Swiss Federal Institute of Technology, Lausanne, Switzerland"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020402443640900_r1",
      "doi-asserted-by": "crossref",
      "first-page": "405",
      "DOI": "10.1088/0957-4484/10/4/308",
      "volume": "10",
      "year": "1999",
      "journal-title": "Nanotechnology"
    },
    {
      "key": "2024020402443640900_r2",
      "doi-asserted-by": "crossref",
      "first-page": "2763",
      "DOI": "10.1063/1.121083",
      "volume": "72",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020402443640900_r3",
      "doi-asserted-by": "crossref",
      "first-page": "14440",
      "DOI": "10.1103/PhysRevB.61.14440",
      "volume": "61",
      "year": "2000",
      "journal-title": "Phys. Rev. B"
    },
    {
      "key": "2024020402443640900_r4",
      "doi-asserted-by": "crossref",
      "first-page": "607",
      "DOI": "10.1063/1.370774",
      "volume": "86",
      "year": "1999",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020402443640900_r5",
      "doi-asserted-by": "crossref",
      "first-page": "101",
      "DOI": "10.1146/annurev.matsci.28.1.101",
      "volume": "28",
      "year": "1998",
      "journal-title": "Annu. Rev. Mater. Sci."
    },
    {
      "key": "2024020402443640900_r6",
      "doi-asserted-by": "crossref",
      "first-page": "1377",
      "DOI": "10.1063/1.1331654",
      "volume": "89",
      "year": "2001",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020402443640900_r7",
      "doi-asserted-by": "crossref",
      "first-page": "818",
      "DOI": "10.1116/1.1364697",
      "volume": "19",
      "year": "2001",
      "journal-title": "J. Vac. Sci. Technol. B"
    },
    {
      "key": "2024020402443640900_r8"
    },
    {
      "key": "2024020402443640900_r9"
    },
    {
      "key": "2024020402443640900_r10"
    },
    {
      "key": "2024020402443640900_r11",
      "doi-asserted-by": "crossref",
      "first-page": "292",
      "DOI": "10.1063/1.126954",
      "volume": "77",
      "year": "2000",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020402443640900_r12",
      "doi-asserted-by": "crossref",
      "first-page": "3275",
      "DOI": "10.1063/1.1322051",
      "volume": "77",
      "year": "2000",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020402443640900_r13",
      "doi-asserted-by": "crossref",
      "first-page": "3492",
      "DOI": "10.1063/1.120369",
      "volume": "71",
      "year": "1997",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020402443640900_r14",
      "doi-asserted-by": "crossref",
      "first-page": "941",
      "DOI": "10.1063/1.366782",
      "volume": "83",
      "year": "1998",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020402443640900_r15",
      "doi-asserted-by": "crossref",
      "first-page": "1565",
      "DOI": "10.1063/1.117031",
      "volume": "69",
      "year": "1996",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020402443640900_r16"
    },
    {
      "key": "2024020402443640900_r17",
      "doi-asserted-by": "crossref",
      "first-page": "263",
      "DOI": "10.1146/annurev.matsci.30.1.263",
      "volume": "30",
      "year": "2000",
      "journal-title": "Annu. Rev. Mater. Sci."
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/84/13/2382/18587327/2382_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/84/13/2382/18587327/2382_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        4
      ]
    ],
    "date-time": "2024-02-04T02:45:06Z",
    "timestamp": 1707014706000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/84/13/2382/508438/Three-dimensional-ferroelectric-domain-imaging-of"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2004,
        3,
        29
      ]
    ]
  },
  "references-count": 17,
  "journal-issue": {
    "issue": "13",
    "published-print": {
      "date-parts": [
        [
          2004,
          3,
          29
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1655695",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2004,
        3,
        29
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2004,
        3,
        29
      ]
    ]
  }
}