DOI: 10.1063/1.1655342. Determination of the depth distribution of implanted helium atoms in niobium by Rutherford backscattering

Determination of the depth distribution of implanted helium atoms in niobium by Rutherford backscattering

10.1063/1.1655342

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Using Bragg's rule of additivity of the stopping powers in compounds and the Rutherford backscattering technique to determine electronic stopping powers, the depth distribution of 4-keV helium ions implanted in niobium was determined for different implantation temperatures.

Bibliography

Roth, J., Behrisch, R., & Scherzer, B. M. U. (1974). Determination of the depth distribution of implanted helium atoms in niobium by Rutherford backscattering. Applied Physics Letters, 25(11), 643â644.

Authors 3

J. Roth (first)
R. Behrisch (additional)
B. M. U. Scherzer (additional)

References 8 Referenced 29

{'key': '2024020508543577700_r1'}
10.1103/PhysRev.87.499 / Phys. Rev. (1952)
10.1016/0040-6090(73)90060-6 / Thin Solid Films (1973)
{'key': '2024020508543577700_r4'}
10.1016/S0092-640X(70)80016-X / Nucl. Data Tables A (1970)
10.1080/00337577308232208 / Radiat. Eff. (1973)
{'key': '2024020508543577700_r7'}
10.1016/0022-3115(72)90045-1 / J. Nucl. Mater. (1972)

Dates

Type	When
Created	21 years, 6 months ago (Jan. 30, 2004, 3:50 p.m.)
Deposited	1 year, 6 months ago (Feb. 5, 2024, 3:54 a.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 5:03 a.m.)
Issued	50 years, 8 months ago (Dec. 1, 1974)
Published	50 years, 8 months ago (Dec. 1, 1974)
Published Print	50 years, 8 months ago (Dec. 1, 1974)

Funders 0

None

BibTeX

@article{Roth_1974, title={Determination of the depth distribution of implanted helium atoms in niobium by Rutherford backscattering}, volume={25}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1655342}, DOI={10.1063/1.1655342}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Roth, J. and Behrisch, R. and Scherzer, B. M. U.}, year={1974}, month=dec, pages={643–644} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        5
      ]
    ],
    "date-time": "2024-02-05T10:03:26Z",
    "timestamp": 1707127406655
  },
  "reference-count": 8,
  "publisher": "AIP Publishing",
  "issue": "11",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1974,
        12,
        1
      ]
    ]
  },
  "abstract": "<jats:p>Using Bragg's rule of additivity of the stopping powers in compounds and the Rutherford backscattering technique to determine electronic stopping powers, the depth distribution of 4-keV helium ions implanted in niobium was determined for different implantation temperatures.</jats:p>",
  "DOI": "10.1063/1.1655342",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        1,
        30
      ]
    ],
    "date-time": "2004-01-30T20:50:06Z",
    "timestamp": 1075495806000
  },
  "page": "643-644",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 29,
  "title": "Determination of the depth distribution of implanted helium atoms in niobium by Rutherford backscattering",
  "prefix": "10.1063",
  "volume": "25",
  "author": [
    {
      "given": "J.",
      "family": "Roth",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Max-Planck-Institut f\u00fcr Plasmaphysik, EURATOM Association, D-8046 Garching b, M\u00fcnchen, Germany"
        }
      ]
    },
    {
      "given": "R.",
      "family": "Behrisch",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Max-Planck-Institut f\u00fcr Plasmaphysik, EURATOM Association, D-8046 Garching b, M\u00fcnchen, Germany"
        }
      ]
    },
    {
      "given": "B. M. U.",
      "family": "Scherzer",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Max-Planck-Institut f\u00fcr Plasmaphysik, EURATOM Association, D-8046 Garching b, M\u00fcnchen, Germany"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020508543577700_r1"
    },
    {
      "key": "2024020508543577700_r2",
      "doi-asserted-by": "crossref",
      "first-page": "499",
      "DOI": "10.1103/PhysRev.87.499",
      "volume": "87",
      "year": "1952",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "2024020508543577700_r3",
      "doi-asserted-by": "crossref",
      "first-page": "247",
      "DOI": "10.1016/0040-6090(73)90060-6",
      "volume": "19",
      "year": "1973",
      "journal-title": "Thin Solid Films"
    },
    {
      "key": "2024020508543577700_r4"
    },
    {
      "key": "2024020508543577700_r5",
      "doi-asserted-by": "crossref",
      "first-page": "233",
      "DOI": "10.1016/S0092-640X(70)80016-X",
      "volume": "7",
      "year": "1970",
      "journal-title": "Nucl. Data Tables A"
    },
    {
      "key": "2024020508543577700_r6",
      "doi-asserted-by": "crossref",
      "first-page": "7",
      "DOI": "10.1080/00337577308232208",
      "volume": "19",
      "year": "1973",
      "journal-title": "Radiat. Eff."
    },
    {
      "key": "2024020508543577700_r7"
    },
    {
      "key": "2024020508543577700_r8",
      "doi-asserted-by": "crossref",
      "first-page": "337",
      "DOI": "10.1016/0022-3115(72)90045-1",
      "volume": "44",
      "year": "1972",
      "journal-title": "J. Nucl. Mater."
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/25/11/643/18430313/643_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/25/11/643/18430313/643_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        5
      ]
    ],
    "date-time": "2024-02-05T08:54:47Z",
    "timestamp": 1707123287000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/25/11/643/44104/Determination-of-the-depth-distribution-of"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1974,
        12,
        1
      ]
    ]
  },
  "references-count": 8,
  "journal-issue": {
    "issue": "11",
    "published-print": {
      "date-parts": [
        [
          1974,
          12,
          1
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1655342",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1974,
        12,
        1
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1974,
        12,
        1
      ]
    ]
  }
}