Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We have computer simulated the structure of thin amorphous films grown from a vapor. Our hard-sphere model shows that structural anisotropy and voids are a natural occurrence of the deposition process. The amount of unfilled space (voids) and the anisotropy have been studied as a function of the angle of incidence of the vapor stream upon the substrate.

Bibliography

Henderson, D., Brodsky, M. H., & Chaudhari, P. (1974). Simulation of structural anisotropy and void formation in amorphous thin films. Applied Physics Letters, 25(11), 641–643.

Authors 3
  1. D. Henderson (first)
  2. M. H. Brodsky (additional)
  3. P. Chaudhari (additional)
References 18 Referenced 183
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Dates
Type When
Created 21 years, 6 months ago (Jan. 30, 2004, 3:50 p.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 3:53 a.m.)
Indexed 2 months, 1 week ago (June 16, 2025, 9:29 a.m.)
Issued 50 years, 8 months ago (Dec. 1, 1974)
Published 50 years, 8 months ago (Dec. 1, 1974)
Published Print 50 years, 8 months ago (Dec. 1, 1974)
Funders 0

None

@article{Henderson_1974, title={Simulation of structural anisotropy and void formation in amorphous thin films}, volume={25}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1655341}, DOI={10.1063/1.1655341}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Henderson, D. and Brodsky, M. H. and Chaudhari, P.}, year={1974}, month=dec, pages={641–643} }