Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Epitaxial growth of a semiconductor film from solid solution by dissolution and transport of an evaporated semiconductor layer through a metal film has been demonstrated. A Ge growth layer of 4800 Å has been obtained by heating the system bulk-Ge/Al/evaporated-Ge at 300 °C. Electrical measurements indicate that the layers are heavily doped p type. A silicon growth of 2000 Å has been obtained by heating the system bulk-Si/Pd/evaporated-Si at 600 °C. Channeling measurements show that the Ge and Si layers are well ordered and epitaxial with the underlying substrate.

Bibliography

Canali, C., Mayer, J. W., Ottaviani, G., Sigurd, D., & van der Weg, W. (1974). Solid-phase transport and epitaxial growth of Ge and Si. Applied Physics Letters, 25(1), 3–5.

Authors 5
  1. C. Canali (first)
  2. J. W. Mayer (additional)
  3. G. Ottaviani (additional)
  4. D. Sigurd (additional)
  5. W. van der Weg (additional)
References 15 Referenced 36
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Dates
Type When
Created 21 years, 7 months ago (Jan. 30, 2004, 3:50 p.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 3:42 a.m.)
Indexed 1 year, 6 months ago (Feb. 5, 2024, 7:22 a.m.)
Issued 51 years, 2 months ago (July 1, 1974)
Published 51 years, 2 months ago (July 1, 1974)
Published Print 51 years, 2 months ago (July 1, 1974)
Funders 0

None

@article{Canali_1974, title={Solid-phase transport and epitaxial growth of Ge and Si}, volume={25}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1655265}, DOI={10.1063/1.1655265}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Canali, C. and Mayer, J. W. and Ottaviani, G. and Sigurd, D. and van der Weg, W.}, year={1974}, month=jul, pages={3–5} }