Abstract
Epitaxial growth of a semiconductor film from solid solution by dissolution and transport of an evaporated semiconductor layer through a metal film has been demonstrated. A Ge growth layer of 4800 Å has been obtained by heating the system bulk-Ge/Al/evaporated-Ge at 300 °C. Electrical measurements indicate that the layers are heavily doped p type. A silicon growth of 2000 Å has been obtained by heating the system bulk-Si/Pd/evaporated-Si at 600 °C. Channeling measurements show that the Ge and Si layers are well ordered and epitaxial with the underlying substrate.
References
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Dates
Type | When |
---|---|
Created | 21 years, 7 months ago (Jan. 30, 2004, 3:50 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 3:42 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 5, 2024, 7:22 a.m.) |
Issued | 51 years, 2 months ago (July 1, 1974) |
Published | 51 years, 2 months ago (July 1, 1974) |
Published Print | 51 years, 2 months ago (July 1, 1974) |
@article{Canali_1974, title={Solid-phase transport and epitaxial growth of Ge and Si}, volume={25}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1655265}, DOI={10.1063/1.1655265}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Canali, C. and Mayer, J. W. and Ottaviani, G. and Sigurd, D. and van der Weg, W.}, year={1974}, month=jul, pages={3–5} }