Abstract
We have obtained a low-loss image from a solid specimen in the high-field region of the condenser-objective lens in a high-resolution SEM. These experiments have demonstrated an edge sharpness of 15 Å and a point-to-point resolution of better than 50 Å between gold dots on a latex ball on a solid substrate. In theory, it should be possible to obtain micrographs from solid specimens with a resolution of 10 Å by this method.
References
8
Referenced
54
10.1063/1.1654527
/ Appl. Phys. Lett. (1973){'key': '2024020508241889300_r2'}
10.1063/1.1653139
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/ Appl. Phys. Lett. (1971){'key': '2024020508241889300_r4a'}
{'key': '2024020508241889300_r5'}
{'key': '2024020508241889300_r6'}
10.1016/0022-2836(70)90052-5
/ J. Mol. Biol. (1970)
Dates
Type | When |
---|---|
Created | 21 years, 6 months ago (Jan. 30, 2004, 3:38 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 5, 2024, 3:24 a.m.) |
Indexed | 1 month ago (July 24, 2025, 7:38 a.m.) |
Issued | 51 years, 11 months ago (Sept. 15, 1973) |
Published | 51 years, 11 months ago (Sept. 15, 1973) |
Published Print | 51 years, 11 months ago (Sept. 15, 1973) |
@article{Wells_1973, title={Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)}, volume={23}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1654916}, DOI={10.1063/1.1654916}, number={6}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Wells, O. C. and Broers, A. N. and Bremer, C. G.}, year={1973}, month=sep, pages={353–355} }