DOI: 10.1063/1.1652955. AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2

AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2

10.1063/1.1652955

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Injection of carriers into thermally grown SiO2 from an avalanche plasma in silicon is a new way of achieving high current densities in SiO2. Electron injection from p-type silicon and hole injection from n-type silicon by hot carrier emission have been observed. Average electron current densities as high as 10−2 A/cm2 have been observed to flow through 1000 Å of SiO2. The oxide becomes negatively charged as a result of electron injection and positively charged as a result of hole injection. These charging effects appear to be related to the presence of water in the oxide.

Bibliography

Nicollian, E. H., Goetzberger, A., & Berglund, C. N. (1969). AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2. Applied Physics Letters, 15(6), 174â177.

Authors 3

E. H. Nicollian (first)
A. Goetzberger (additional)
C. N. Berglund (additional)

References 16 Referenced 132

10.1103/PhysRev.140.A569 / Phys. Rev. (1965)
10.1016/0038-1098(67)90715-6 / Solid State Commun. (1967)
10.1063/1.1657043 / J. Appl. Phys. (1969)
{'key': '2024020507003971000_r3', 'first-page': '686', 'volume': 'ED-15', 'year': '1968', 'journal-title': 'Trans. Electron Dev.'} / Trans. Electron Dev. (1968)
10.1063/1.1709189 / J. Appl. Phys. (1967)
{'key': '2024020507003971000_r5'}
{'key': '2024020507003971000_r6'}
{'key': '2024020507003971000_r7'}
{'key': '2024020507003971000_r8'}
{'key': '2024020507003971000_r9'}
10.1103/PhysRev.130.972 / Phys. Rev. (1963)
10.1149/1.2426565 / J. Electrochem. Soc. (1967)
10.1039/tf9615702247 / Trans. Faraday Soc. (1961)
{'key': '2024020507003971000_r13', 'first-page': '35', 'volume': '5', 'year': '1964', 'journal-title': 'Phys. Chem. Glasses'} / Phys. Chem. Glasses (1964)
{'key': '2024020507003971000_r14'}
{'key': '2024020507003971000_r15'}

Dates

Type	When
Created	21 years, 6 months ago (Jan. 30, 2004, 3:11 p.m.)
Deposited	1 year, 6 months ago (Feb. 5, 2024, 2 a.m.)
Indexed	1 year ago (Aug. 14, 2024, 11:08 a.m.)
Issued	55 years, 11 months ago (Sept. 15, 1969)
Published	55 years, 11 months ago (Sept. 15, 1969)
Published Print	55 years, 11 months ago (Sept. 15, 1969)

Funders 0

None

BibTeX

@article{Nicollian_1969, title={AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2}, volume={15}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1652955}, DOI={10.1063/1.1652955}, number={6}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Nicollian, E. H. and Goetzberger, A. and Berglund, C. N.}, year={1969}, month=sep, pages={174–177} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        8,
        14
      ]
    ],
    "date-time": "2024-08-14T15:08:11Z",
    "timestamp": 1723648091781
  },
  "reference-count": 16,
  "publisher": "AIP Publishing",
  "issue": "6",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        1969,
        9,
        15
      ]
    ]
  },
  "abstract": "<jats:p>Injection of carriers into thermally grown SiO2 from an avalanche plasma in silicon is a new way of achieving high current densities in SiO2. Electron injection from p-type silicon and hole injection from n-type silicon by hot carrier emission have been observed. Average electron current densities as high as 10\u22122 A/cm2 have been observed to flow through 1000 \u00c5 of SiO2. The oxide becomes negatively charged as a result of electron injection and positively charged as a result of hole injection. These charging effects appear to be related to the presence of water in the oxide.</jats:p>",
  "DOI": "10.1063/1.1652955",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2004,
        1,
        30
      ]
    ],
    "date-time": "2004-01-30T20:11:53Z",
    "timestamp": 1075493513000
  },
  "page": "174-177",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 132,
  "title": "AVALANCHE INJECTION CURRENTS AND CHARGING PHENOMENA IN THERMAL SiO2",
  "prefix": "10.1063",
  "volume": "15",
  "author": [
    {
      "given": "E. H.",
      "family": "Nicollian",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Bell Telephone Laboratories, Inc., Murray Hill, New Jersey 07974"
        }
      ]
    },
    {
      "given": "A.",
      "family": "Goetzberger",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Bell Telephone Laboratories, Inc., Murray Hill, New Jersey 07974"
        }
      ]
    },
    {
      "given": "C. N.",
      "family": "Berglund",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Bell Telephone Laboratories, Inc., Murray Hill, New Jersey 07974"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020507003971000_r1",
      "doi-asserted-by": "crossref",
      "first-page": "A569",
      "DOI": "10.1103/PhysRev.140.A569",
      "volume": "140",
      "year": "1965",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "2024020507003971000_r2",
      "doi-asserted-by": "crossref",
      "first-page": "813",
      "DOI": "10.1016/0038-1098(67)90715-6",
      "volume": "5",
      "year": "1967",
      "journal-title": "Solid State Commun."
    },
    {
      "key": "2024020507003971000_r2a",
      "doi-asserted-by": "crossref",
      "first-page": "278",
      "DOI": "10.1063/1.1657043",
      "volume": "40",
      "year": "1969",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020507003971000_r3",
      "first-page": "686",
      "volume": "ED-15",
      "year": "1968",
      "journal-title": "Trans. Electron Dev."
    },
    {
      "key": "2024020507003971000_r4",
      "doi-asserted-by": "crossref",
      "first-page": "4582",
      "DOI": "10.1063/1.1709189",
      "volume": "38",
      "year": "1967",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020507003971000_r5"
    },
    {
      "key": "2024020507003971000_r6"
    },
    {
      "key": "2024020507003971000_r7"
    },
    {
      "key": "2024020507003971000_r8"
    },
    {
      "key": "2024020507003971000_r9"
    },
    {
      "key": "2024020507003971000_r10",
      "doi-asserted-by": "crossref",
      "first-page": "972",
      "DOI": "10.1103/PhysRev.130.972",
      "volume": "130",
      "year": "1963",
      "journal-title": "Phys. Rev."
    },
    {
      "key": "2024020507003971000_r11",
      "doi-asserted-by": "crossref",
      "first-page": "266",
      "DOI": "10.1149/1.2426565",
      "volume": "114",
      "year": "1967",
      "journal-title": "J. Electrochem. Soc."
    },
    {
      "key": "2024020507003971000_r12",
      "doi-asserted-by": "crossref",
      "first-page": "2247",
      "DOI": "10.1039/tf9615702247",
      "volume": "57",
      "year": "1961",
      "journal-title": "Trans. Faraday Soc."
    },
    {
      "key": "2024020507003971000_r13",
      "first-page": "35",
      "volume": "5",
      "year": "1964",
      "journal-title": "Phys. Chem. Glasses"
    },
    {
      "key": "2024020507003971000_r14"
    },
    {
      "key": "2024020507003971000_r15"
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/15/6/174/18422508/174_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/15/6/174/18422508/174_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        5
      ]
    ],
    "date-time": "2024-02-05T07:00:46Z",
    "timestamp": 1707116446000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/15/6/174/41728/AVALANCHE-INJECTION-CURRENTS-AND-CHARGING"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        1969,
        9,
        15
      ]
    ]
  },
  "references-count": 16,
  "journal-issue": {
    "issue": "6",
    "published-print": {
      "date-parts": [
        [
          1969,
          9,
          15
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1652955",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        1969,
        9,
        15
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        1969,
        9,
        15
      ]
    ]
  }
}