Abstract
We have fabricated Pt/C composite nanowires and nanowire transistors, using the technique of electron-beam-induced deposition. The current-voltage characteristics of the granular nanowires are strongly nonlinear at 4.2 K, and evidence for this nonlinearity is found to persist to room temperature. A voltage gap of order 0.1–0.2 V is observed at the lowest temperatures, and we suggest that this feature is consistent with single-electron tunneling via Pt nanocrystals that form in the wires during their fabrication. In order to further explore this possibility, we incorporate the nanowires into three-terminal transistor structures and find evidence for a gate-induced modulation of their voltage gap.
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Dates
Type | When |
---|---|
Created | 21 years, 9 months ago (Nov. 22, 2003, 6:53 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 8:54 p.m.) |
Indexed | 1 year ago (Aug. 5, 2024, 2:32 p.m.) |
Issued | 21 years, 8 months ago (Nov. 24, 2003) |
Published | 21 years, 8 months ago (Nov. 24, 2003) |
Published Print | 21 years, 8 months ago (Nov. 24, 2003) |
@article{Rotkina_2003, title={Nonlinear current-voltage characteristics of Pt nanowires and nanowire transistors fabricated by electron-beam deposition}, volume={83}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1629382}, DOI={10.1063/1.1629382}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Rotkina, L. and Lin, J.-F. and Bird, J. P.}, year={2003}, month=nov, pages={4426–4428} }