Crossref journal-article
AIP Publishing
Review of Scientific Instruments (317)
Abstract

In tapping-mode atomic-force microscopy usually amplitude and phase of the cantilever motion are acquired. These signals are related to the fundamental oscillation frequency neglecting information at higher frequencies. However, the nonlinear contact between tip and sample induces higher frequency vibrations that are harmonics of the fundamental. In order to recover the available information the full tip motion has to be analyzed. The higher harmonics can be employed for image formation. A setup that consists of two independently operated lock-in amplifiers is used to detect higher harmonics in the dynamic atomic-force microscopy signal. Higher harmonic imaging proves to be useful to monitor the imaging conditions in tapping mode and can be applied for nanoscale imaging with a material contrast.

Bibliography

Stark, R. W., & Heckl, W. M. (2003). Higher harmonics imaging in tapping-mode atomic-force microscopy. Review of Scientific Instruments, 74(12), 5111–5114.

Authors 2
  1. Robert W. Stark (first)
  2. Wolfgang M. Heckl (additional)
References 18 Referenced 128
  1. 10.1088/0957-4484/8/2/004 / Nanotechnology (1997)
  2. 10.1063/1.479422 / J. Chem. Phys. (1999)
  3. 10.1016/S0304-3991(03)00043-3 / Ultramicroscopy (2003)
  4. 10.1016/S0167-5729(02)00077-8 / Surf. Sci. Rep. (2002)
  5. 10.1016/S0039-6028(96)01591-9 / Surf. Sci. (1997)
  6. 10.1016/S0039-6028(00)00378-2 / Surf. Sci. (2000)
  7. 10.1063/1.126683 / Appl. Phys. Lett. (2000)
  8. 10.1063/1.1325404 / Appl. Phys. Lett. (2000)
  9. 10.1063/1.1429296 / Appl. Phys. Lett. (2001)
  10. 10.1063/1.1456543 / Appl. Phys. Lett. (2002)
  11. 10.1073/pnas.122040599 / Proc. Natl. Acad. Sci. U.S.A. (2002)
  12. {'key': '2024020519574902700_r12'}
  13. 10.1063/1.123323 / Appl. Phys. Lett. (1999)
  14. {'key': '2024020519574902700_r14'}
  15. 10.1016/0021-9797(75)90018-1 / J. Colloid Interface Sci. (1975)
  16. 10.1103/PhysRevB.61.R13381 / Phys. Rev. B (2000)
  17. 10.1016/S0304-3991(00)00077-2 / Ultramicroscopy (2001)
  18. 10.1103/PhysRevB.67.193404 / Phys. Rev. B (2003)
Dates
Type When
Created 21 years, 9 months ago (Nov. 22, 2003, 6:53 p.m.)
Deposited 1 year, 6 months ago (Feb. 5, 2024, 3:53 p.m.)
Indexed 4 months ago (April 18, 2025, 8:25 a.m.)
Issued 21 years, 8 months ago (Dec. 1, 2003)
Published 21 years, 8 months ago (Dec. 1, 2003)
Published Print 21 years, 8 months ago (Dec. 1, 2003)
Funders 0

None

@article{Stark_2003, title={Higher harmonics imaging in tapping-mode atomic-force microscopy}, volume={74}, ISSN={1089-7623}, url={http://dx.doi.org/10.1063/1.1626008}, DOI={10.1063/1.1626008}, number={12}, journal={Review of Scientific Instruments}, publisher={AIP Publishing}, author={Stark, Robert W. and Heckl, Wolfgang M.}, year={2003}, month=dec, pages={5111–5114} }