Abstract
Bi 4−x La x Ti 3 O 12 materials were synthesized by the sol-gel process and thin films were prepared on Pt (i.e., Pt/TiO2/SiO2/Si) substrate by spin coating. Structural properties of the films were examined by x-ray diffraction and Raman spectroscopy. Dielectric and ferroelectric response was studied for 0.63-μm-thick Bi3.44La0.56Ti3O12 films. Butterfly dielectric behavior and remnant polarization of up to Pr=41 μC/cm2 has been achieved. These films also showed fatigue free response up to 109 switching cycles. On the basis of these studies, large polarization in Bi3.44La0.56Ti3O12 films is attributed to dipole formation which may tilt TiO6 octahedra to Bi2O2 interlayer.
References
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Dates
Type | When |
---|---|
Created | 22 years, 1 month ago (July 10, 2003, 6:28 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 7:56 p.m.) |
Indexed | 1 year, 1 month ago (July 28, 2024, 12:32 a.m.) |
Issued | 22 years, 1 month ago (July 14, 2003) |
Published | 22 years, 1 month ago (July 14, 2003) |
Published Print | 22 years, 1 month ago (July 14, 2003) |
@article{Tomar_2003, title={Structural and ferroelectric studies of Bi3.44La0.56Ti3O12 films}, volume={83}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1592308}, DOI={10.1063/1.1592308}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tomar, M. S. and Melgarejo, R. E. and Hidalgo, A. and Mazumder, S. B. and Katiyar, R. S.}, year={2003}, month=jul, pages={341–343} }