Abstract
The origin of the superstructure observed in epitaxial yttrium oxide (Y2O3) layers on Si (001) is determined by electron energy loss spectroscopy (EELS). The oxygen K edge is measured both in the superstructure and a defect-free region of the Y2O3 layers and they are compared to EELS spectra obtained from bulk stoichiometric and reduced Y2O3. It is shown that as a result of the epitaxial growth, oxygen vacancies order into a superstructure creating nonstoichiometric regions in an otherwise stoichiometric Y2O3 layer. Furthermore, it is shown that oxygen deficiency introduces a change of the density of states of the lower conduction band of Y2O3.
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Dates
Type | When |
---|---|
Created | 22 years, 2 months ago (June 6, 2003, 2:43 p.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 7:41 p.m.) |
Indexed | 1 day, 17 hours ago (Aug. 20, 2025, 8:35 a.m.) |
Issued | 22 years, 2 months ago (June 9, 2003) |
Published | 22 years, 2 months ago (June 9, 2003) |
Published Print | 22 years, 2 months ago (June 9, 2003) |
@article{Travlos_2003, title={Oxygen vacancy ordering in epitaxial layers of yttrium oxide on Si (001)}, volume={82}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1581985}, DOI={10.1063/1.1581985}, number={23}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Travlos, A. and Boukos, N. and Apostolopoulos, G. and Dimoulas, A.}, year={2003}, month=jun, pages={4053–4055} }