DOI: 10.1063/1.1556561. Electron spin resonance microscopic surface imaging using a microwave scanning probe

Electron spin resonance microscopic surface imaging using a microwave scanning probe

10.1063/1.1556561

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report on a scanning electron-spin-resonance microscopy based on a microwave near-field probe. The probe consists of an open dielectric resonator with a thin-slit aperture. The spatial resolution in one direction is determined by the slit width and can be varied between 1 and 100 μm, while the spatial resolution in the perpendicular direction is ∼10 times larger. We demonstrate spatially-resolved measurements on diphenyl-picryl-hydrazil samples on a substrate. A sensitivity of 1011 spins could be achieved using a 4-μm-wide slit operating at 8.5 GHz and in a contact mode.

Bibliography

Sakran, F., Copty, A., Golosovsky, M., Bontemps, N., Davidov, D., & Frenkel, A. (2003). Electron spin resonance microscopic surface imaging using a microwave scanning probe. Applied Physics Letters, 82(9), 1479â1481.

Authors 6

F. Sakran (first)
A. Copty (additional)
M. Golosovsky (additional)
N. Bontemps (additional)
D. Davidov (additional)
A. Frenkel (additional)

References 25 Referenced 18

{'key': '2024020400040319600_r1'}
10.1016/S1386-1425(01)00723-5 / Spectrochim. Acta, Part A (2002)
10.1063/1.1482150 / Rev. Sci. Instrum. (2002)
10.1063/1.1332978 / Appl. Phys. Lett. (2000)
10.1063/1.1355298 / Appl. Phys. Lett. (2001)
10.1063/1.1728690 / J. Appl. Phys. (1962)
{'key': '2024020400040319600_r7', 'first-page': '293', 'volume': '2', 'year': '1991', 'journal-title': 'Chem. Lett.'} / Chem. Lett. (1991)
10.1063/1.1144490 / Rev. Sci. Instrum. (1994)
10.1063/1.124880 / Appl. Phys. Lett. (1999)
{'key': '2024020400040319600_r10', 'first-page': '3846', 'volume': '69', 'year': '1999', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. (1999)
10.1103/RevModPhys.67.249 / Rev. Mod. Phys. (1995)
10.1063/1.372748 / J. Appl. Phys. (2000)
10.1063/1.121081 / Appl. Phys. Lett. (1998)
10.1103/PhysRevB.61.16223 / Phys. Rev. B (2000)
10.1063/1.1434301 / Appl. Phys. Lett. (2002)
10.1016/S0370-1573(98)00057-X / Phys. Rep. (1999)
10.1063/1.1399306 / Appl. Phys. Lett. (2001)
{'key': '2024020400040319600_r18'}
10.1063/1.1351837 / Rev. Sci. Instrum. (2001)
10.1063/1.1289680 / Rev. Sci. Instrum. (2000)
10.1063/1.116685 / Appl. Phys. Lett. (1996)
10.1016/S1386-1425(01)00722-3 / Spectrochimica Acta, Part A (2002)
{'key': '2024020400040319600_r23'}
10.1080/00150199908225283 / Ferroelectrics (1999)
10.1006/jmre.2001.2415 / J. Magn. Reson. (2001)

Dates

Type	When
Created	22 years, 6 months ago (Feb. 28, 2003, 4:15 p.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 7:04 p.m.)
Indexed	1 year, 6 months ago (Feb. 6, 2024, 9:47 a.m.)
Issued	22 years, 6 months ago (March 3, 2003)
Published	22 years, 6 months ago (March 3, 2003)
Published Print	22 years, 6 months ago (March 3, 2003)

Funders 0

None

BibTeX

@article{Sakran_2003, title={Electron spin resonance microscopic surface imaging using a microwave scanning probe}, volume={82}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1556561}, DOI={10.1063/1.1556561}, number={9}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Sakran, F. and Copty, A. and Golosovsky, M. and Bontemps, N. and Davidov, D. and Frenkel, A.}, year={2003}, month=mar, pages={1479–1481} }

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