Abstract
We report on charge injection in individual silicon nanoparticles deposited on conductive substrates. Charges are injected using a metal-plated atomic force microscope tip, and detected by electric force microscopy (EFM). Due to the screening efficiency of the conductive substrate, up to ∼200 positive or negative charges can be stored at moderate (<10 V) tip–substrate injection voltage in ∼40 nm high nanoparticles, with discharging time constants of a few minutes. We propose an analytical model in the plane-capacitor approximation to estimate the nanoparticle charge from EFM data. It falls in quantitative agreement with numerical calculations using realistic tip/nanoparticle/substrate geometries.
References
8
Referenced
54
10.1063/1.116085
/ Appl. Phys. Lett. (1996)10.1063/1.1371783
/ Appl. Phys. Lett. (2001)10.1063/1.1383574
/ Appl. Phys. Lett. (2001)10.1209/epl/i2002-00143-x
/ Europhys. Lett. (2002)10.1063/1.338807
/ J. Appl. Phys. (1987)10.1063/1.126603
/ Appl. Phys. Lett. (2000)10.1063/1.1420761
/ J. Appl. Phys. (2002)10.1103/PhysRevLett.83.4840
/ Phys. Rev. Lett. (1999)
Dates
Type | When |
---|---|
Created | 22 years, 8 months ago (Dec. 19, 2002, 9:13 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 6:43 p.m.) |
Indexed | 1 year, 4 months ago (May 2, 2024, 4:29 a.m.) |
Issued | 22 years, 8 months ago (Dec. 23, 2002) |
Published | 22 years, 8 months ago (Dec. 23, 2002) |
Published Print | 22 years, 8 months ago (Dec. 23, 2002) |
@article{M_lin_2002, title={Charge injection in individual silicon nanoparticles deposited on a conductive substrate}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1532110}, DOI={10.1063/1.1532110}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Mélin, T. and Deresmes, D. and Stiévenard, D.}, year={2002}, month=dec, pages={5054–5056} }