Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We report on charge injection in individual silicon nanoparticles deposited on conductive substrates. Charges are injected using a metal-plated atomic force microscope tip, and detected by electric force microscopy (EFM). Due to the screening efficiency of the conductive substrate, up to ∼200 positive or negative charges can be stored at moderate (<10 V) tip–substrate injection voltage in ∼40 nm high nanoparticles, with discharging time constants of a few minutes. We propose an analytical model in the plane-capacitor approximation to estimate the nanoparticle charge from EFM data. It falls in quantitative agreement with numerical calculations using realistic tip/nanoparticle/substrate geometries.

Bibliography

Mélin, T., Deresmes, D., & Stiévenard, D. (2002). Charge injection in individual silicon nanoparticles deposited on a conductive substrate. Applied Physics Letters, 81(26), 5054–5056.

Authors 3
  1. T. Mélin (first)
  2. D. Deresmes (additional)
  3. D. Stiévenard (additional)
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Dates
Type When
Created 22 years, 8 months ago (Dec. 19, 2002, 9:13 a.m.)
Deposited 1 year, 7 months ago (Feb. 3, 2024, 6:43 p.m.)
Indexed 1 year, 4 months ago (May 2, 2024, 4:29 a.m.)
Issued 22 years, 8 months ago (Dec. 23, 2002)
Published 22 years, 8 months ago (Dec. 23, 2002)
Published Print 22 years, 8 months ago (Dec. 23, 2002)
Funders 0

None

@article{M_lin_2002, title={Charge injection in individual silicon nanoparticles deposited on a conductive substrate}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1532110}, DOI={10.1063/1.1532110}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Mélin, T. and Deresmes, D. and Stiévenard, D.}, year={2002}, month=dec, pages={5054–5056} }