Abstract
We show improvement of the optical and topographical resolution of scanning near-field optical microscopy by introducing a “tip-on-aperture” probe, a metallic tip formed on the aperture of a conventional fiber probe. The tip concentrates the light passing through the aperture. Thus the advantages of aperture and apertureless scanning near-field optical microscopy are combined. Tips are grown by electron beam deposition and then covered with metal. Fluorescent beads are imaged with a resolution down to 25 nm (full width at half maximum) in the optical signal. The near-field appears strongly localized within 5 nm in z direction, thus promising even higher resolution with sharper tips.
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Dates
Type | When |
---|---|
Created | 22 years, 8 months ago (Dec. 19, 2002, 9:13 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 6:44 p.m.) |
Indexed | 1 year, 2 months ago (June 12, 2024, 3:51 p.m.) |
Issued | 22 years, 8 months ago (Dec. 23, 2002) |
Published | 22 years, 8 months ago (Dec. 23, 2002) |
Published Print | 22 years, 8 months ago (Dec. 23, 2002) |
@article{Frey_2002, title={Enhancing the resolution of scanning near-field optical microscopy by a metal tip grown on an aperture probe}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1530736}, DOI={10.1063/1.1530736}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Frey, Heinrich G. and Keilmann, Fritz and Kriele, Armin and Guckenberger, Reinhard}, year={2002}, month=dec, pages={5030–5032} }