DOI: 10.1063/1.1512815. Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy

Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy

10.1063/1.1512815

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We describe a method of measuring the electrical properties of a molecule via conducting atomic force microscopy (AFM). A dithiolated molecule is chemically inserted into defect sites in an insulating self-assembled monolayer formed on an epitaxial Au substrate and the top thiol terminus of the molecule is reacted with a Au nanoparticle. A Au-coated AFM probe is used to contact the molecule through the nanoparticle, thus electrical data can be obtained. We report preliminary transport measurements of two test molecules. Our data shows qualitative agreement with previously published results for similar molecules deposited in a nanopore containing approximately a thousand molecules. This work indicates that the measured negative differential resistance is not an intermolecular phenomenon.

Bibliography

Rawlett, A. M., Hopson, T. J., Nagahara, L. A., Tsui, R. K., Ramachandran, G. K., & Lindsay, S. M. (2002). Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy. Applied Physics Letters, 81(16), 3043â3045.

Authors 6

Adam M. Rawlett (first)
Theresa J. Hopson (additional)
Larry A. Nagahara (additional)
Raymond K. Tsui (additional)
Ganesh K. Ramachandran (additional)
Stuart M. Lindsay (additional)

References 17 Referenced 168

{'key': '2024020323114574500_r1'}
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Dates

Type	When
Created	22 years, 10 months ago (Oct. 10, 2002, 10:19 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 6:11 p.m.)
Indexed	4 months, 2 weeks ago (April 21, 2025, 12:25 a.m.)
Issued	22 years, 10 months ago (Oct. 14, 2002)
Published	22 years, 10 months ago (Oct. 14, 2002)
Published Print	22 years, 10 months ago (Oct. 14, 2002)

Funders 0

None

BibTeX

@article{Rawlett_2002, title={Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1512815}, DOI={10.1063/1.1512815}, number={16}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Rawlett, Adam M. and Hopson, Theresa J. and Nagahara, Larry A. and Tsui, Raymond K. and Ramachandran, Ganesh K. and Lindsay, Stuart M.}, year={2002}, month=oct, pages={3043–3045} }

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