Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

Ceria is a transparent oxide suitable for various optical and optoelectronic devices. In this work, we tailor independently the refractive index n and fundamental gap Eg of nanocrystalline Ceria films by varying the substrate temperature or using Ar+ ion beams during growth with electron beam evaporation. Spectroscopic ellipsometry and x-ray reflectivity are employed to study n and Eg and to identify the physical parameters that affect them. We correlate n (varies from 1.65 to 2.15 in the studied films) with the film density through a universal, square law. The film composition strongly affects Eg, which varies from 2.8 to ∼2.0 eV. The optical absorption below 3 eV and the Eg shift are attributed to O-defect states and not to modifications in interband transitions.

Bibliography

Patsalas, P., Logothetidis, S., & Metaxa, C. (2002). Optical performance of nanocrystalline transparent ceria films. Applied Physics Letters, 81(3), 466–468.

Authors 3
  1. P. Patsalas (first)
  2. S. Logothetidis (additional)
  3. C. Metaxa (additional)
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Dates
Type When
Created 23 years, 1 month ago (July 28, 2002, 6:05 p.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 5:38 p.m.)
Indexed 2 months, 1 week ago (June 25, 2025, 5:52 a.m.)
Issued 23 years, 1 month ago (July 15, 2002)
Published 23 years, 1 month ago (July 15, 2002)
Published Print 23 years, 1 month ago (July 15, 2002)
Funders 0

None

@article{Patsalas_2002, title={Optical performance of nanocrystalline transparent ceria films}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1494458}, DOI={10.1063/1.1494458}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Patsalas, P. and Logothetidis, S. and Metaxa, C.}, year={2002}, month=jul, pages={466–468} }