Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We report on calculations of the formation energies of several [100] and [110] oriented step structures on biaxially stressed Si and Ge (001) surfaces. It is shown that a novel rebonded [100] oriented single-height step is strongly stabilized by compressive strain compared to most well-known step structures. We propose that the side walls of “hut”-shaped quantum dots observed in recent experiments on SiGe/Si films are made up of these steps. Our calculations provide an explanation for the nucleationless growth of shallow mounds, with steps along the [100] and [110] directions in low- and high-misfit films, respectively, and for the stability of the (105) facets under compressive strain.

Bibliography

Shenoy, V. B., Ciobanu, C. V., & Freund, L. B. (2002). Strain induced stabilization of stepped Si and Ge surfaces near (001). Applied Physics Letters, 81(2), 364–366.

Authors 3
  1. V. B. Shenoy (first)
  2. C. V. Ciobanu (additional)
  3. L. B. Freund (additional)
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Dates
Type When
Created 23 years ago (July 28, 2002, 6:05 p.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 5:36 p.m.)
Indexed 3 weeks, 4 days ago (Aug. 2, 2025, 12:24 a.m.)
Issued 23 years, 1 month ago (July 8, 2002)
Published 23 years, 1 month ago (July 8, 2002)
Published Print 23 years, 1 month ago (July 8, 2002)
Funders 0

None

@article{Shenoy_2002, title={Strain induced stabilization of stepped Si and Ge surfaces near (001)}, volume={81}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1491611}, DOI={10.1063/1.1491611}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Shenoy, V. B. and Ciobanu, C. V. and Freund, L. B.}, year={2002}, month=jul, pages={364–366} }