Crossref journal-article
AIP Publishing
Journal of Applied Physics (317)
Abstract

High-resolution transmission electron microscopy in conjunction with autocorrelation function analysis have been applied to investigate the evolution of structural order in germanium ion-implanted amorphous silicon (a-Si) layers. A high density of Si nanocrystallites as small as 1 nm in size was detected in as-implanted a-Si layers. The density of embedded nanocrystalline Si was found to diminish in a-Si layers with annealing temperature first then increase. The results are discussed in the context of free energy change with annealing temperature.

Bibliography

Cheng, S. L., Lin, H. H., He, J. H., Chiang, T. F., Yu, C. H., Chen, L. J., Yang, C. K., Wu, D. Y., Chien, S. C., & Chen, W. C. (2002). Evolution of structural order in germanium ion-implanted amorphous silicon layers. Journal of Applied Physics, 92(2), 910–913.

Authors 10
  1. S. L. Cheng (first)
  2. H. H. Lin (additional)
  3. J. H. He (additional)
  4. T. F. Chiang (additional)
  5. C. H. Yu (additional)
  6. L. J. Chen (additional)
  7. C. K. Yang (additional)
  8. D. Y. Wu (additional)
  9. S. C. Chien (additional)
  10. W. C. Chen (additional)
References 23 Referenced 16
  1. {'key': '2024021108133990900_r1', 'first-page': '1', 'volume': 'R24', 'year': '1998', 'journal-title': 'Mater. Sci. Eng.'} / Mater. Sci. Eng. (1998)
  2. 10.1063/1.97382 / Appl. Phys. Lett. (1986)
  3. 10.1109/16.766888 / IEEE Trans. Electron Devices (1999)
  4. 10.1103/PhysRevLett.31.92 / Phys. Rev. Lett. (1973)
  5. 10.1103/PhysRevLett.54.1392 / Phys. Rev. Lett. (1985)
  6. 10.1038/325121a0 / Nature (London) (1987)
  7. 10.1103/PhysRevLett.78.1074 / Phys. Rev. Lett. (1997)
  8. 10.1016/S0022-3093(98)00371-8 / J. Non-Cryst. Solids (1998)
  9. 10.1016/0022-3093(71)90038-X / J. Non-Cryst. Solids (1971)
  10. 10.1016/0022-3093(85)90260-1 / J. Non-Cryst. Solids (1985)
  11. 10.1557/JMR.2001.0416 / J. Mater. Res. (2001)
  12. {'key': '2024021108133990900_r12'}
  13. {'key': '2024021108133990900_r13'}
  14. 10.1016/0304-3991(85)90201-3 / Ultramicroscopy (1985)
  15. 10.1063/1.110846 / Appl. Phys. Lett. (1994)
  16. 10.1063/1.123300 / Appl. Phys. Lett. (1999)
  17. 10.1016/S0927-796X(00)00023-1 / Mater. Sci. Eng., R. (2000)
  18. {'key': '2024021108133990900_r18'}
  19. {'key': '2024021108133990900_r19'}
  20. 10.1016/S0168-583X(96)00824-5 / Nucl. Instrum. Methods Phys. Res. B (1997)
  21. {'key': '2024021108133990900_r21'}
  22. 10.1103/PhysRevLett.66.1102 / Phys. Rev. Lett. (1991)
  23. 10.1038/262454a0 / Nature (London) (1976)
Dates
Type When
Created 23 years, 1 month ago (July 28, 2002, 6:05 p.m.)
Deposited 1 year, 6 months ago (Feb. 11, 2024, 3:13 a.m.)
Indexed 1 year, 3 months ago (May 14, 2024, 9:45 p.m.)
Issued 23 years, 1 month ago (July 15, 2002)
Published 23 years, 1 month ago (July 15, 2002)
Published Print 23 years, 1 month ago (July 15, 2002)
Funders 0

None

@article{Cheng_2002, title={Evolution of structural order in germanium ion-implanted amorphous silicon layers}, volume={92}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1486256}, DOI={10.1063/1.1486256}, number={2}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Cheng, S. L. and Lin, H. H. and He, J. H. and Chiang, T. F. and Yu, C. H. and Chen, L. J. and Yang, C. K. and Wu, D. Y. and Chien, S. C. and Chen, W. C.}, year={2002}, month=jul, pages={910–913} }