DOI: 10.1063/1.1456541. Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy

Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy

10.1063/1.1456541

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We report a polarization-sensitive scanning microwave microscope based on a bimodal dielectric resonator with a cross-slit aperture. The microscope operates at ∼26 GHz in the reflection mode and has a subwavelength spatial resolution. It allows contactless mapping of the conductivity tensor, including magnetic-field-induced terms such as the Hall effect. We demonstrate local contactless measurement of the ordinary Hall effect in semiconducting wafers and of the extraordinary Hall effect in thin ferromagnetic Ni films. The latter yields out-of-plane magnetization. The microwave measurements are in good agreement with the dc Hall-effect measurements.

Bibliography

Abu-Teir, M., Sakran, F., Golosovsky, M., Davidov, D., & Frenkel, A. (2002). Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy. Applied Physics Letters, 80(10), 1776â1778.

Authors 5

M. Abu-Teir (first)
F. Sakran (additional)
M. Golosovsky (additional)
D. Davidov (additional)
A. Frenkel (additional)

References 21 Referenced 6

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10.1063/1.356814 / J. Appl. Phys. (1994)
10.1063/1.121925 / Appl. Phys. Lett. (1998)
{'key': '2024020321503685700_r5'}
10.1063/1.119456 / Appl. Phys. Lett. (1997)
10.1103/PhysRevLett.73.1537 / Phys. Rev. Lett. (1994)
10.1063/1.116685 / Appl. Phys. Lett. (1996)
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10.1109/22.910553 / IEEE Trans. Microwave Theory Tech. (2001)
10.1063/1.120918 / Appl. Phys. Lett. (1998)
{'key': '2024020321503685700_r12', 'first-page': '3846', 'volume': '69', 'year': '1999', 'journal-title': 'Rev. Sci. Instrum.'} / Rev. Sci. Instrum. (1999)
{'key': '2024020321503685700_r13', 'first-page': '70', 'volume': '59', 'year': '2001', 'journal-title': 'Mater. Eval.'} / Mater. Eval. (2001)
10.1063/1.1332978 / Appl. Phys. Lett. (2000)
10.1063/1.124880 / Appl. Phys. Lett. (1999)
10.1063/1.1351837 / Rev. Sci. Instrum. (2001)
10.1063/1.124454 / Appl. Phys. Lett. (1999)
10.1088/0957-0233/2/8/010 / Meas. Sci. Technol. (1991)
{'key': '2024020321503685700_r19'}
10.1063/1.1289680 / Rev. Sci. Instrum. (2000)
10.1016/0038-1098(96)00029-4 / Solid State Commun. (1996)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:26 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 4:52 p.m.)
Indexed	1 year, 6 months ago (Feb. 5, 2024, 8:27 p.m.)
Issued	23 years, 5 months ago (March 11, 2002)
Published	23 years, 5 months ago (March 11, 2002)
Published Print	23 years, 5 months ago (March 11, 2002)

Funders 0

None

BibTeX

@article{Abu_Teir_2002, title={Local contactless measurement of the ordinary and extraordinary Hall effect using near-field microwave microscopy}, volume={80}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1456541}, DOI={10.1063/1.1456541}, number={10}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Abu-Teir, M. and Sakran, F. and Golosovsky, M. and Davidov, D. and Frenkel, A.}, year={2002}, month=mar, pages={1776–1778} }

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