DOI: 10.1063/1.1449532. Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films

10.1063/1.1449532

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The structural and electrical properties of metalorganic chemical vapor deposition-grown Pb(Zr0.35Ti0.65)O3 thin films ranging in thickness from 700 to 4000 Å have been investigated. Cross-sectional scanning electron microscopy showed that these films are columnar, with grains extending through the thickness of the film. High-resolution x-ray diffraction showed that while the thickest films are tetragonal, with reflections corresponding to a-type and c-type domains, films thinner than 1500 Å are not. Electron backscatter diffraction and hysteresis loop measurements showed that the thinnest films are ferroelectric and have a rhombohedral crystal structure.

Bibliography

Kelman, M. B., Schloss, L. F., McIntyre, P. C., Hendrix, B. C., Bilodeau, S. M., & Roeder, J. F. (2002). Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films. Applied Physics Letters, 80(7), 1258â1260.

Authors 6

Maxim B. Kelman (first)
Lawrence F. Schloss (additional)
Paul C. McIntyre (additional)
Bryan C. Hendrix (additional)
Steven M. Bilodeau (additional)
Jeffrey F. Roeder (additional)

References 13 Referenced 37

10.1146/annurev.matsci.30.1.263 / Annu. Rev. Mater. Sci. (2000)
10.1007/BF00584864 / J. Mater. Sci. (1990)
10.1103/PhysRevLett.80.1988 / Phys. Rev. Lett. (1998)
{'key': '2024020321445434200_r4'}
10.1002/1099-0712(200005/10)10:3/5<145::AID-AMO416>3.0.CO;2-2 / Adv. Mater. Opt. Electron. (2000)
{'key': '2024020321445434200_r6'}
10.1016/0020-7683(92)90015-L / Int. J. Solids Struct. (1992)
{'key': '2024020321445434200_r8'}
{'key': '2024020321445434200_r9'}
10.1080/10584589908215617 / Integr. Ferroelectr. (1999)
10.1063/1.357589 / J. Appl. Phys. (1994)
{'key': '2024020321445434200_r12'}
10.1103/PhysRevB.55.3485 / Phys. Rev. B (1997)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:24 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 4:49 p.m.)
Indexed	1 year, 6 months ago (Feb. 7, 2024, 6:55 p.m.)
Issued	23 years, 6 months ago (Feb. 18, 2002)
Published	23 years, 6 months ago (Feb. 18, 2002)
Published Print	23 years, 6 months ago (Feb. 18, 2002)

Funders 0

None

BibTeX

@article{Kelman_2002, title={Thickness-dependent phase evolution of polycrystalline Pb(Zr0.35Ti0.65)O3 thin films}, volume={80}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1449532}, DOI={10.1063/1.1449532}, number={7}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Kelman, Maxim B. and Schloss, Lawrence F. and McIntyre, Paul C. and Hendrix, Bryan C. and Bilodeau, Steven M. and Roeder, Jeffrey F.}, year={2002}, month=feb, pages={1258–1260} }

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