Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

We report a microwave surface imaging technique using a near-field scanning microwave microscope with a tunable resonance cavity. By tuning the resonance cavity, we could demonstrate improved sensitivity and spatial resolution of the topographic image of YBa2Cu3Oy thin films on MgO substrates. By measuring the shift of resonant frequency and the change of quality factor, we obtained near-field scanning microwave images with a spatial resolution better than 4 μm at an operating frequency of f=1–1.5 GHz. The principal of operation could be explained by the perturbation theory of a coaxial resonant cavity, considering the radius of the probe tip, the sample–tip distance, and the impedance matching.

Bibliography

Hong, S., Kim, J., Park, W., & Lee, K. (2002). Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator. Applied Physics Letters, 80(3), 524–526.

Authors 4
  1. Sunghyuk Hong (first)
  2. Jooyoung Kim (additional)
  3. Wonkyun Park (additional)
  4. Kiejin Lee (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:08 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 4:27 p.m.)
Indexed 1 year, 6 months ago (Feb. 13, 2024, 10:48 a.m.)
Issued 23 years, 7 months ago (Jan. 21, 2002)
Published 23 years, 7 months ago (Jan. 21, 2002)
Published Print 23 years, 7 months ago (Jan. 21, 2002)
Funders 0

None

@article{Hong_2002, title={Improved surface imaging with a near-field scanning microwave microscope using a tunable resonator}, volume={80}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1435068}, DOI={10.1063/1.1435068}, number={3}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Hong, Sunghyuk and Kim, Jooyoung and Park, Wonkyun and Lee, Kiejin}, year={2002}, month=jan, pages={524–526} }