Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

The degradation in electroluminescence of poly(p-phenylene vinylene)-based organic light-emitting devices is studied using optical microscopy, scanning electron microscopy, and secondary ion mass spectroscopy. “Bubbles” are formed at the polymer and indium tin oxide interface or in the polymer layer within the nonemissive area. This formation, which occurs during device electrical stress, is accompanied by a fluctuation of the device current. The bubbles are formed by the degraded polymer and/or the gas released from disintegration of the polymer. High local current density flowing near the dark spot center and the resultant heating, decomposes the polymer layer. The resultant carbonized area causes either local short circuit and/or open circuit leading to the final light-emitting device failure.

Bibliography

Ke, L., Chua, S.-J., Zhang, K., & Chen, P. (2002). Bubble formation due to electrical stress in organic light emitting devices. Applied Physics Letters, 80(2), 171–173.

Authors 4
  1. Lin Ke (first)
  2. Soo-Jin Chua (additional)
  3. Keran Zhang (additional)
  4. Peng Chen (additional)
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Dates
Type When
Created 23 years ago (July 26, 2002, 9:24 a.m.)
Deposited 1 year, 6 months ago (Feb. 3, 2024, 4:32 p.m.)
Indexed 2 months, 1 week ago (June 14, 2025, 2:22 a.m.)
Issued 23 years, 7 months ago (Jan. 14, 2002)
Published 23 years, 7 months ago (Jan. 14, 2002)
Published Print 23 years, 7 months ago (Jan. 14, 2002)
Funders 0

None

@article{Ke_2002, title={Bubble formation due to electrical stress in organic light emitting devices}, volume={80}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1435064}, DOI={10.1063/1.1435064}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ke, Lin and Chua, Soo-Jin and Zhang, Keran and Chen, Peng}, year={2002}, month=jan, pages={171–173} }