Abstract
The degradation in electroluminescence of poly(p-phenylene vinylene)-based organic light-emitting devices is studied using optical microscopy, scanning electron microscopy, and secondary ion mass spectroscopy. “Bubbles” are formed at the polymer and indium tin oxide interface or in the polymer layer within the nonemissive area. This formation, which occurs during device electrical stress, is accompanied by a fluctuation of the device current. The bubbles are formed by the degraded polymer and/or the gas released from disintegration of the polymer. High local current density flowing near the dark spot center and the resultant heating, decomposes the polymer layer. The resultant carbonized area causes either local short circuit and/or open circuit leading to the final light-emitting device failure.
References
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:24 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 4:32 p.m.) |
Indexed | 2 months, 1 week ago (June 14, 2025, 2:22 a.m.) |
Issued | 23 years, 7 months ago (Jan. 14, 2002) |
Published | 23 years, 7 months ago (Jan. 14, 2002) |
Published Print | 23 years, 7 months ago (Jan. 14, 2002) |
@article{Ke_2002, title={Bubble formation due to electrical stress in organic light emitting devices}, volume={80}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1435064}, DOI={10.1063/1.1435064}, number={2}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Ke, Lin and Chua, Soo-Jin and Zhang, Keran and Chen, Peng}, year={2002}, month=jan, pages={171–173} }