DOI: 10.1063/1.1421219. Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films

Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films

10.1063/1.1421219

Crossref journal-article

AIP Publishing

Journal of Applied Physics (317)

Abstract

Voltage-modulated scanning force microscopy (Piezoresponse microscopy) is applied to investigate the domain structure in epitaxial PbZr0.2Ti0.8O3 ferroelectric thin films grown on (001) SrTiO3. By monitoring the vertical and lateral differential signals from the photodetector of the atomic force microscope it is possible to separate out and observe the out-of-plane and in-plane polarization vectors in the thin film individually. The relative orientation of the polarization vectors across a 90° domain wall is observed. Nucleation of new reversed 180° domains at the 90° domain wall is studied and its impact on the rotation of polarization within the a domain is analyzed as a function of reversal time.

Bibliography

Ganpule, C. S., Nagarajan, V., Hill, B. K., Roytburd, A. L., Williams, E. D., Ramesh, R., Alpay, S. P., Roelofs, A., Waser, R., & Eng, L. M. (2002). Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films. Journal of Applied Physics, 91(3), 1477â1481.

Authors 10

C. S. Ganpule (first)
V. Nagarajan (additional)
B. K. Hill (additional)
A. L. Roytburd (additional)
E. D. Williams (additional)
R. Ramesh (additional)
S. P. Alpay (additional)
A. Roelofs (additional)
R. Waser (additional)
L. M. Eng (additional)

References 26 Referenced 127

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Dates

Type	When
Created	23 years ago (July 26, 2002, 9:24 a.m.)
Deposited	1 year, 6 months ago (Feb. 6, 2024, 4:45 a.m.)
Indexed	1 year ago (July 29, 2024, 3:10 p.m.)
Issued	23 years, 6 months ago (Feb. 1, 2002)
Published	23 years, 6 months ago (Feb. 1, 2002)
Published Print	23 years, 6 months ago (Feb. 1, 2002)

Funders 0

None

BibTeX

@article{Ganpule_2002, title={Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films}, volume={91}, ISSN={1089-7550}, url={http://dx.doi.org/10.1063/1.1421219}, DOI={10.1063/1.1421219}, number={3}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Ganpule, C. S. and Nagarajan, V. and Hill, B. K. and Roytburd, A. L. and Williams, E. D. and Ramesh, R. and Alpay, S. P. and Roelofs, A. and Waser, R. and Eng, L. M.}, year={2002}, month=feb, pages={1477–1481} }

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