Abstract
A two-dimensional simulation of intrinsic top-contact field-effect transistor is presented. The simulated structure is unique to organic transistors and hence is most relevant. By time resolving the operation of such a transistor, the mechanisms underlying its operation are resolved. The effect of this device configuration on the measured “intrinsic” material properties is also discussed and shown to explain previously reported features.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 10:24 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 4:02 p.m.) |
Indexed | 4 months, 3 weeks ago (April 12, 2025, 1:07 a.m.) |
Issued | 23 years, 10 months ago (Oct. 29, 2001) |
Published | 23 years, 10 months ago (Oct. 29, 2001) |
Published Print | 23 years, 10 months ago (Oct. 29, 2001) |
@article{Tessler_2001, title={Two-dimensional simulation of polymer field-effect transistor}, volume={79}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1415374}, DOI={10.1063/1.1415374}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Tessler, N. and Roichman, Y.}, year={2001}, month=oct, pages={2987–2989} }