DOI: 10.1063/1.1414299. Scanning-nonlinear-dielectric-microscopy study on periodically poled LiNbO3 for a high-performance quasi-phase matching device

Scanning-nonlinear-dielectric-microscopy study on periodically poled LiNbO3 for a high-performance quasi-phase matching device

10.1063/1.1414299

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Studies of the domain distribution of periodically poled LiNbO3 (PPLN) using scanning nonlinear dielectric microscopy (SNDM) were performed for high-quality quasi-phase matching (QPM) devices and some very important results were obtained. First, a single domain surface layer formed on PPLN was found and second, the SNDM studies also revealed that a very strong residual stress or an internal electric field remained in PPLN fabricated using the application of a high voltage due to the pinning effect in single crystal LiNbO3. This stress or internal field substantially reduced the nonlinear dielectric constant of LiNbO3. By annealing to release this stress, it was confirmed that the LiNbO3 recovered from the reduced nonlinear dielectric constant. In the optical region, this constant is equivalent to the second harmonic generation constant, therefore, it is proposed that annealing is an effective method for obtaining a highly efficient high-performance QPM device.

Bibliography

Cho, Y., Kazuta, S., & Ito, H. (2001). Scanning-nonlinear-dielectric-microscopy study on periodically poled LiNbO3 for a high-performance quasi-phase matching device. Applied Physics Letters, 79(18), 2955â2957.

Authors 3

Yasuo Cho (first)
Satoshi Kazuta (additional)
Hiromasa Ito (additional)

References 9 Referenced 19

{'key': '2024020321034689300_r1', 'first-page': '651', 'volume': '25', 'year': '2000', 'journal-title': 'Appl. Phys. Lett.'} / Appl. Phys. Lett. (2000)
10.1063/1.1146936 / Rev. Sci. Instrum. (1996)
{'key': '2024020321034689300_r3', 'first-page': '3123', 'volume': '37', 'year': '1998', 'journal-title': 'Jpn. J. Appl. Phys., Part 1'} / Jpn. J. Appl. Phys., Part 1 (1998)
10.1143/JJAP.38.3279 / Jpn. J. Appl. Phys., Part 1 (1999)
10.1063/1.125165 / Appl. Phys. Lett. (1999)
10.1143/JJAP.39.5719 / Jpn. J. Appl. Phys., Part 1 (2000)
10.1088/0957-4484/8/3A/008 / Nanotechnology (1997)
10.1063/1.122676 / Appl. Phys. Lett. (1998)
10.1063/1.1754022 / Appl. Phys. Lett. (1964)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:59 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 4:03 p.m.)
Indexed	1 year, 7 months ago (Feb. 3, 2024, 10:24 p.m.)
Issued	23 years, 10 months ago (Oct. 29, 2001)
Published	23 years, 10 months ago (Oct. 29, 2001)
Published Print	23 years, 10 months ago (Oct. 29, 2001)

Funders 0

None

BibTeX

@article{Cho_2001, title={Scanning-nonlinear-dielectric-microscopy study on periodically poled LiNbO3 for a high-performance quasi-phase matching device}, volume={79}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1414299}, DOI={10.1063/1.1414299}, number={18}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Cho, Yasuo and Kazuta, Satoshi and Ito, Hiromasa}, year={2001}, month=oct, pages={2955–2957} }

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