Abstract
Specular x-ray reflectivity has been used to probe the microstructures of siloxane-based self-assembled electro-optic superlattices composed of high-hyperpolarizable organic chromophore arrays intercalated with Ga and In oxide sheets. The film thickness increases linearly as a function of the number of layers, underscoring the high structural regularity and efficiency of the synthetic approach. Relatively dense metal oxide structures are detected in these systems. The x-ray reflectivity data also indicate that the dependence of the relative surface roughness on the number of layers is nearly identical for self-assembled organic and organic–inorganic hybrid film structures.
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:26 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 7, 2024, 12:45 a.m.) |
Indexed | 1 year, 6 months ago (Feb. 7, 2024, 1:12 a.m.) |
Issued | 23 years, 10 months ago (Oct. 8, 2001) |
Published | 23 years, 10 months ago (Oct. 8, 2001) |
Published Print | 23 years, 10 months ago (Oct. 8, 2001) |
@article{Evmenenko_2001, title={Specular x-ray reflectivity study of ordering in self-assembled organic and hybrid organic–inorganic electro-optic multilayer films}, volume={115}, ISSN={1089-7690}, url={http://dx.doi.org/10.1063/1.1398576}, DOI={10.1063/1.1398576}, number={14}, journal={The Journal of Chemical Physics}, publisher={AIP Publishing}, author={Evmenenko, G. and van der Boom, M. E. and Kmetko, J. and Dugan, S. W. and Marks, T. J. and Dutta, P.}, year={2001}, month=oct, pages={6722–6727} }