Abstract
The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (>109 A/cm2) show that no observable failure in the nanotube structure and no measurable change in the resistance are detected at temperatures up to 250 °C and for time scales up to 2 weeks. Our results suggest that nanotubes are potential candidates as interconnects in future large-scale integrated nanoelectronic devices.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 10:18 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 3:38 p.m.) |
Indexed | 9 hours, 11 minutes ago (Aug. 30, 2025, 12:26 p.m.) |
Issued | 24 years ago (Aug. 20, 2001) |
Published | 24 years ago (Aug. 20, 2001) |
Published Print | 24 years ago (Aug. 20, 2001) |
@article{Wei_2001, title={Reliability and current carrying capacity of carbon nanotubes}, volume={79}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1396632}, DOI={10.1063/1.1396632}, number={8}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Wei, B. Q. and Vajtai, R. and Ajayan, P. M.}, year={2001}, month=aug, pages={1172–1174} }