Abstract
We measured and formulated dielectric exchange forces between adsorbed layers of self-assembled surfactant films and atomic-force microscope tips in water. The dielectric exchange-force model is in agreement with the observation that the surfactant-layer rupture forces (tip-applied force necessary to obtain tip/substrate contact) are smaller in the thickest layers, where the compactness of the adsorbed film results in the smallest values of the dielectric permittivity. Within experimental accuracy, a dielectric permittivity value of ∼4 for bilayers and of ∼36 for monolayers is found.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:26 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 3:04 p.m.) |
Indexed | 1 year, 6 months ago (Feb. 3, 2024, 3:40 p.m.) |
Issued | 24 years, 3 months ago (May 14, 2001) |
Published | 24 years, 3 months ago (May 14, 2001) |
Published Print | 24 years, 3 months ago (May 14, 2001) |
@article{Teschke_2001, title={Dielectric exchange-force effect on the rupture force of adsorbed bilayers of self-assembled surfactant films}, volume={78}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1358369}, DOI={10.1063/1.1358369}, number={20}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Teschke, O. and Ceotto, G. and de Souza, E. F.}, year={2001}, month=may, pages={3064–3066} }