DOI: 10.1063/1.1334658. Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes

Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes

10.1063/1.1334658

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

We have designed and batch-fabricated thin-film thermocouple cantilever probes for scanning thermal microscopy (SThM). Here, we report the use of these probes for imaging the phonon temperature distribution of electrically heated carbon-nanotube (CN) circuits. The SThM images reveal possible heat dissipation mechanisms in CN circuits. The experiments also demonstrate that heat flow through the tip-sample nanoscale junction under ambient conditions is dominated by conduction through a liquid film bridging the two surfaces. With the spatial resolution limited by tip radius to about 50 nm, SThM now offers the promising prospects of studying electron-phonon interactions and phonon transport in low dimensional nanostructures.

Bibliography

Shi, L., Plyasunov, S., Bachtold, A., McEuen, P. L., & Majumdar, A. (2000). Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes. Applied Physics Letters, 77(26), 4295â4297.

Authors 5

Li Shi (first)
Sergei Plyasunov (additional)
Adrian Bachtold (additional)
Paul L. McEuen (additional)
Arunava Majumdar (additional)

References 14 Referenced 147

{'key': '2024020319235732400_r1'}
10.1038/19941 / Nature (London) (1999)
10.1126/science.271.5251.933 / Science (1996)
{'key': '2024020319235732400_r4'}
10.1115/1.2824246 / J. Heat Transfer (1998)
10.1146/annurev.matsci.29.1.505 / Annu. Rev. Mater. Sci. (1999)
10.1116/1.589319 / J. Vac. Sci. Technol. B (1997)
10.1143/JJAP.33.3785 / Jpn. J. Appl. Phys., Part 1 (1994)
10.1007/s003390051101 / Appl. Phys. A: Mater. Sci. Process. (1998)
10.1063/1.1148902 / Rev. Sci. Instrum. (1998)
10.1063/1.121453 / Appl. Phys. Lett. (1998)
{'key': '2024020319235732400_r12', 'first-page': '93', 'volume': '1', 'year': '1999', 'journal-title': 'ASME Int. Mech. Eng. Congress & Exposition, MEMS'} / ASME Int. Mech. Eng. Congress & Exposition, MEMS (1999)
{'key': '2024020319235732400_r13'}
{'key': '2024020319235732400_r14'}

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 10:13 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 2:24 p.m.)
Indexed	1 week, 6 days ago (Aug. 21, 2025, 1:34 p.m.)
Issued	24 years, 8 months ago (Dec. 25, 2000)
Published	24 years, 8 months ago (Dec. 25, 2000)
Published Print	24 years, 8 months ago (Dec. 25, 2000)

Funders 0

None

BibTeX

@article{Shi_2000, title={Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1334658}, DOI={10.1063/1.1334658}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Shi, Li and Plyasunov, Sergei and Bachtold, Adrian and McEuen, Paul L. and Majumdar, Arunava}, year={2000}, month=dec, pages={4295–4297} }

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