Abstract
A Maxwell–Wagner series capacitor model is proposed to explain anomalous dielectric properties of ferroelectric superlattices. The results of the model show that a superlattice consisting of normal ferroelectric layers separated by low-resistivity interfacial regions can account for most experimental results reported to date, namely: dielectric enhancement for certain stacking periodicities, giant permittivities, and temperature migration of dielectric maxima as a function of frequency. The predictions of the model are discussed and compared to our own experimental results from thin film superlattice capacitors made by pulsed-laser deposition.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:41 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 2:05 p.m.) |
Indexed | 3 weeks, 3 days ago (Aug. 7, 2025, 5:01 p.m.) |
Issued | 24 years, 9 months ago (Nov. 6, 2000) |
Published | 24 years, 9 months ago (Nov. 6, 2000) |
Published Print | 24 years, 9 months ago (Nov. 6, 2000) |
@article{Catalan_2000, title={Relaxor features in ferroelectric superlattices: A Maxwell–Wagner approach}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1324729}, DOI={10.1063/1.1324729}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Catalan, G. and O’Neill, D. and Bowman, R. M. and Gregg, J. M.}, year={2000}, month=nov, pages={3078–3080} }