Abstract
We have developed a simple, fast, and flexible technique to measure optical scattering spectra of individual metallic nanoparticles. The particles are placed in an evanescent field produced by total internal reflection of light from a halogen lamp in a glass prism. The light scattered by individual particles is collected using a conventional microscope and is spectrally analyzed by a nitrogen-cooled charge-coupled-device array coupled to a spectrometer. This technique is employed to measure the effect of particle diameter on the dephasing time of the particle plasmon resonance in gold nanoparticles. We also demonstrate the use of this technique for measurements in liquids, which is important for the potential application of particle plasmons in chemical or biological nanosensors.
Bibliography
Sönnichsen, C., Geier, S., Hecker, N. E., von Plessen, G., Feldmann, J., Ditlbacher, H., Lamprecht, B., Krenn, J. R., Aussenegg, F. R., Chan, V. Z.-H., Spatz, J. P., & Möller, M. (2000). Spectroscopy of single metallic nanoparticles using total internal reflection microscopy. Applied Physics Letters, 77(19), 2949â2951.
Authors
12
- C. Sönnichsen (first)
- S. Geier (additional)
- N. E. Hecker (additional)
- G. von Plessen (additional)
- J. Feldmann (additional)
- H. Ditlbacher (additional)
- B. Lamprecht (additional)
- J. R. Krenn (additional)
- F. R. Aussenegg (additional)
- V. Z-H. Chan (additional)
- J. P. Spatz (additional)
- M. Möller (additional)
References
17
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325
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 8:41 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 2:04 p.m.) |
Indexed | 1 month, 4 weeks ago (July 1, 2025, 6:29 a.m.) |
Issued | 24 years, 9 months ago (Nov. 6, 2000) |
Published | 24 years, 9 months ago (Nov. 6, 2000) |
Published Print | 24 years, 9 months ago (Nov. 6, 2000) |
@article{S_nnichsen_2000, title={Spectroscopy of single metallic nanoparticles using total internal reflection microscopy}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1323553}, DOI={10.1063/1.1323553}, number={19}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Sönnichsen, C. and Geier, S. and Hecker, N. E. and von Plessen, G. and Feldmann, J. and Ditlbacher, H. and Lamprecht, B. and Krenn, J. R. and Aussenegg, F. R. and Chan, V. Z-H. and Spatz, J. P. and Möller, M.}, year={2000}, month=nov, pages={2949–2951} }