DOI: 10.1063/1.1308539. Direct observation of lasing mode in a microdisk laser by a near-field-probing technique

Direct observation of lasing mode in a microdisk laser by a near-field-probing technique

10.1063/1.1308539

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

Evanescent field profiles of whispering gallery (WG) modes in a 1.6-μm-GaInAsP microdisk injection laser were investigated by scanning a nanoprobe near the periphery of a lasing microdisk. The increase in threshold current due to the light scattering by the probe and the corresponding decrease in laser light were observed experimentally. Two-dimensional images of the evanescent field, which agreed well with theoretical expectations, were obtained by the use of a Pt–Ir probe. The images indicate that the WG mode is strongly locked by the fourfold symmetry in the microdisk with center post claddings. This characteristic is favorable for the microdisk laser itself to be used as an active near-field probe. A lower contrast image obtained by the use of a tapered silica fiber probe suggests that the microdisk probe can be sensitive to both surface profiles and optical properties of the object.

Bibliography

Baba, T., Yamada, H., & Sakai, A. (2000). Direct observation of lasing mode in a microdisk laser by a near-field-probing technique. Applied Physics Letters, 77(11), 1584â1586.

Authors 3

Toshihiko Baba (first)
Hiroshi Yamada (additional)
Atsushi Sakai (additional)

References 8 Referenced 9

10.1049/el:19920642 / Electron. Lett. (1992)
10.1109/68.593330 / IEEE Photonics Technol. Lett. (1997)
10.1109/2944.788434 / IEEE J. Sel. Top Quantum Electron (1999)
10.1049/el:20000609 / Electron. Lett. (2000)
{'key': '2024020318440984600_r5'}
{'key': '2024020318440984600_r6', 'first-page': '517', 'volume': '37A', 'year': '1998', 'journal-title': 'Jpn. J. Appl. Phys., Part 1'} / Jpn. J. Appl. Phys., Part 1 (1998)
{'key': '2024020318440984600_r7', 'first-page': '222', 'volume': '27', 'year': '1999', 'journal-title': 'Electron. Lett.'} / Electron. Lett. (1999)
10.1063/1.123285 / Appl. Phys. Lett. (1999)

Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 6 months ago (Feb. 3, 2024, 1:44 p.m.)
Indexed	1 year, 6 months ago (Feb. 3, 2024, 7:36 p.m.)
Issued	24 years, 11 months ago (Sept. 11, 2000)
Published	24 years, 11 months ago (Sept. 11, 2000)
Published Print	24 years, 11 months ago (Sept. 11, 2000)

Funders 0

None

BibTeX

@article{Baba_2000, title={Direct observation of lasing mode in a microdisk laser by a near-field-probing technique}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.1308539}, DOI={10.1063/1.1308539}, number={11}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Baba, Toshihiko and Yamada, Hiroshi and Sakai, Atsushi}, year={2000}, month=sep, pages={1584–1586} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        4
      ]
    ],
    "date-time": "2024-02-04T00:36:47Z",
    "timestamp": 1707007007750
  },
  "reference-count": 8,
  "publisher": "AIP Publishing",
  "issue": "11",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2000,
        9,
        11
      ]
    ]
  },
  "abstract": "<jats:p>Evanescent field profiles of whispering gallery (WG) modes in a 1.6-\u03bcm-GaInAsP microdisk injection laser were investigated by scanning a nanoprobe near the periphery of a lasing microdisk. The increase in threshold current due to the light scattering by the probe and the corresponding decrease in laser light were observed experimentally. Two-dimensional images of the evanescent field, which agreed well with theoretical expectations, were obtained by the use of a Pt\u2013Ir probe. The images indicate that the WG mode is strongly locked by the fourfold symmetry in the microdisk with center post claddings. This characteristic is favorable for the microdisk laser itself to be used as an active near-field probe. A lower contrast image obtained by the use of a tapered silica fiber probe suggests that the microdisk probe can be sensitive to both surface profiles and optical properties of the object.</jats:p>",
  "DOI": "10.1063/1.1308539",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T13:29:07Z",
    "timestamp": 1027690147000
  },
  "page": "1584-1586",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 9,
  "title": "Direct observation of lasing mode in a microdisk laser by a near-field-probing technique",
  "prefix": "10.1063",
  "volume": "77",
  "author": [
    {
      "given": "Toshihiko",
      "family": "Baba",
      "sequence": "first",
      "affiliation": [
        {
          "name": "Yokohama National University, Division of Electrical and Computer Engineering, 79-5 Tokiwadai, Hodogayaku, Yokohama 240-8501,\u2009Japan"
        }
      ]
    },
    {
      "given": "Hiroshi",
      "family": "Yamada",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Yokohama National University, Division of Electrical and Computer Engineering, 79-5 Tokiwadai, Hodogayaku, Yokohama 240-8501,\u2009Japan"
        }
      ]
    },
    {
      "given": "Atsushi",
      "family": "Sakai",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "Yokohama National University, Division of Electrical and Computer Engineering, 79-5 Tokiwadai, Hodogayaku, Yokohama 240-8501,\u2009Japan"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020318440984600_r1",
      "doi-asserted-by": "crossref",
      "first-page": "1010",
      "DOI": "10.1049/el:19920642",
      "volume": "28",
      "year": "1992",
      "journal-title": "Electron. Lett."
    },
    {
      "key": "2024020318440984600_r2",
      "doi-asserted-by": "crossref",
      "first-page": "878",
      "DOI": "10.1109/68.593330",
      "volume": "9",
      "year": "1997",
      "journal-title": "IEEE Photonics Technol. Lett."
    },
    {
      "key": "2024020318440984600_r3",
      "doi-asserted-by": "crossref",
      "first-page": "673",
      "DOI": "10.1109/2944.788434",
      "volume": "5",
      "year": "1999",
      "journal-title": "IEEE J. Sel. Top Quantum Electron"
    },
    {
      "key": "2024020318440984600_r4",
      "doi-asserted-by": "crossref",
      "first-page": "790",
      "DOI": "10.1049/el:20000609",
      "volume": "36",
      "year": "2000",
      "journal-title": "Electron. Lett."
    },
    {
      "key": "2024020318440984600_r5"
    },
    {
      "key": "2024020318440984600_r6",
      "first-page": "517",
      "volume": "37A",
      "year": "1998",
      "journal-title": "Jpn. J. Appl. Phys., Part 1"
    },
    {
      "key": "2024020318440984600_r7",
      "first-page": "222",
      "volume": "27",
      "year": "1999",
      "journal-title": "Electron. Lett."
    },
    {
      "key": "2024020318440984600_r8",
      "doi-asserted-by": "crossref",
      "first-page": "176",
      "DOI": "10.1063/1.123285",
      "volume": "74",
      "year": "1999",
      "journal-title": "Appl. Phys. Lett."
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/77/11/1584/18552073/1584_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/77/11/1584/18552073/1584_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        3
      ]
    ],
    "date-time": "2024-02-03T18:44:19Z",
    "timestamp": 1706985859000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/77/11/1584/112634/Direct-observation-of-lasing-mode-in-a-microdisk"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2000,
        9,
        11
      ]
    ]
  },
  "references-count": 8,
  "journal-issue": {
    "issue": "11",
    "published-print": {
      "date-parts": [
        [
          2000,
          9,
          11
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.1308539",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2000,
        9,
        11
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2000,
        9,
        11
      ]
    ]
  }
}