Crossref journal-article
AIP Publishing
Applied Physics Letters (317)
Abstract

External electro-optic probes fabricated from two different crystal orientations of GaAs have been implemented in an electro-optic sampling system that is capable of mapping three independent orthogonal components of free-space electric fields. The results obtained for the radiated field from a microstrip patch antenna by the GaAs probes are compared with results on the same antenna obtained using bismuth silicate and lithium tantalate probes. An 8 μm spatial resolution has also been demonstrated for the electro-optic field-mapping system, and the capability for the system to measure field patterns at frequencies up to 100 GHz has been shown.

Bibliography

Yang, K., Katehi, L. P. B., & Whitaker, J. F. (2000). Electro-optic field mapping system utilizing external gallium arsenide probes. Applied Physics Letters, 77(4), 486–488.

Authors 3
  1. K. Yang (first)
  2. L. P. B. Katehi (additional)
  3. J. F. Whitaker (additional)
References 11 Referenced 47
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Dates
Type When
Created 23 years, 1 month ago (July 26, 2002, 9:31 a.m.)
Deposited 1 year, 7 months ago (Feb. 3, 2024, 1:29 p.m.)
Indexed 4 months, 3 weeks ago (April 13, 2025, 12:53 a.m.)
Issued 25 years, 1 month ago (July 24, 2000)
Published 25 years, 1 month ago (July 24, 2000)
Published Print 25 years, 1 month ago (July 24, 2000)
Funders 0

None

@article{Yang_2000, title={Electro-optic field mapping system utilizing external gallium arsenide probes}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.127019}, DOI={10.1063/1.127019}, number={4}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Yang, K. and Katehi, L. P. B. and Whitaker, J. F.}, year={2000}, month=jul, pages={486–488} }