Abstract
Vacancy-related defect profiles have been measured for La0.5Sr0.5CoO3/(Pb0.9La0.1)(Zr0.2Ti0.8)O3/La0.5Sr0.5CoO3 ferroelectric capacitors using a variable-energy positron beam. By varying the layer thickness and the postgrowth processing in a reducing ambient, a capacitor showing oxygen deficiency dominantly in the top electrode and one with deficiency in both electrodes were produced. The capacitor with an asymmetric defect profile showed a voltage offset polarization–voltage hysteresis loop, that with a symmetric distribution of vacancy-related defects showed no offset. These results are discussed in the context of current models for imprint.
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Dates
Type | When |
---|---|
Created | 23 years, 1 month ago (July 26, 2002, 9:31 a.m.) |
Deposited | 1 year, 7 months ago (Feb. 3, 2024, 1:21 p.m.) |
Indexed | 6 days, 23 hours ago (Aug. 30, 2025, 12:36 p.m.) |
Issued | 25 years, 2 months ago (July 3, 2000) |
Published | 25 years, 2 months ago (July 3, 2000) |
Published Print | 25 years, 2 months ago (July 3, 2000) |
@article{Friessnegg_2000, title={Vacancy formation in (Pb,La)(Zr,Ti)O3 capacitors with oxygen deficiency and the effect on voltage offset}, volume={77}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.126898}, DOI={10.1063/1.126898}, number={1}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Friessnegg, T. and Aggarwal, S. and Ramesh, R. and Nielsen, B. and Poindexter, E. H. and Keeble, D. J.}, year={2000}, month=jul, pages={127–129} }