DOI: 10.1063/1.126839. Structural origin of coercivity enhancement and exchange-bias field in double antiferromagnet/ferromagnet bilayers

Structural origin of coercivity enhancement and exchange-bias field in double antiferromagnet/ferromagnet bilayers

10.1063/1.126839

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

An experimental method to identify the structural origins of the coercivity enhancement and the exchange-bias field of polycrystalline ferro-antiferromagnetic (F/AF) coupled systems is proposed. The exchange-bias field and the coercivity of the FI layer of the samples of the structure FI/AFI are compared with those of the FII layer of the samples of the structure FII/AFII/FIII/AFIII. It is concluded that, for a given temperature, it is those AF grains which stop their growth at a critical thickness that contribute to the coercivity enhancement, and those which grow over the critical thickness that contribute to the exchange-bias field. Meanwhile the effective magnetic surface anisotropy introduced to the top surface of the AFII layer by the FIII layer can increase the exchange-bias field of the FII layer when the AFII layer is thin.

Bibliography

Hou, C., Fujiwara, H., & Zhang, K. (2000). Structural origin of coercivity enhancement and exchange-bias field in double antiferromagnet/ferromagnet bilayers. Applied Physics Letters, 76(26), 3974â3976.

Authors 3

C. Hou (first)
H. Fujiwara (additional)
K. Zhang (additional)

References 18 Referenced 9

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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 8:42 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 1:18 p.m.)
Indexed	1 year, 1 month ago (July 4, 2024, 12:01 p.m.)
Issued	25 years, 2 months ago (June 26, 2000)
Published	25 years, 2 months ago (June 26, 2000)
Published Print	25 years, 2 months ago (June 26, 2000)

Funders 0

None

BibTeX

@article{Hou_2000, title={Structural origin of coercivity enhancement and exchange-bias field in double antiferromagnet/ferromagnet bilayers}, volume={76}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.126839}, DOI={10.1063/1.126839}, number={26}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Hou, C. and Fujiwara, H. and Zhang, K.}, year={2000}, month=jun, pages={3974–3976} }

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