Abstract
Local magnification effects related to the presence of a second phase in three-dimensional atom probe have been investigated using a simulation of ion trajectories from the analyzed sample surface. Spherical precipitates containing only B atoms embedded in pure A solid solution were considered. The magnification was found to vary drastically from 0.5 to 2.0 times when the evaporation field of B (EB) was varied from 1.15 EA to 0.85 EA. The trajectories were found to overlap over distances close to 1 nm only when the reduced evaporation field (εB=EB/EA) is outside of a gap ranging from 0.9 to 1.1. Simulations indicate that the “measured” composition in the inner core of precipitates is not biased in this gap. This is also the case for particles which have a diameter larger than a critical value of 2 nm.
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Dates
Type | When |
---|---|
Created | 23 years ago (July 26, 2002, 9:29 a.m.) |
Deposited | 1 year, 6 months ago (Feb. 3, 2024, 1:09 p.m.) |
Indexed | 2 weeks, 1 day ago (Aug. 6, 2025, 8:16 a.m.) |
Issued | 25 years, 3 months ago (May 22, 2000) |
Published | 25 years, 3 months ago (May 22, 2000) |
Published Print | 25 years, 3 months ago (May 22, 2000) |
@article{Vurpillot_2000, title={Trajectory overlaps and local magnification in three-dimensional atom probe}, volume={76}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.126545}, DOI={10.1063/1.126545}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Vurpillot, F. and Bostel, A. and Blavette, D.}, year={2000}, month=may, pages={3127–3129} }