DOI: 10.1063/1.126537. Effect of uniaxial stress on the polarization of SrBi2Ta2O9 thin films

Effect of uniaxial stress on the polarization of SrBi2Ta2O9 thin films

10.1063/1.126537

Crossref journal-article

AIP Publishing

Applied Physics Letters (317)

Abstract

The effect of uniaxial stress on the ferroelectric properties of SrBi2Ta2O9 films with different thicknesses (330, 440, and 660 nm) has been investigated. It is found that both the remnant polarization (Pr) and the spontaneous polarization (Ps) decrease with the application of compressive stress, but increase with the application of tensile stress. And the changes of Pr and Ps become larger for thicker films. For the 660 nm film, as the stress changed from −100 MPa (compressive) to +100 MPa (tensile), the Pr increases from −1.8% to +1.8%. Testing voltages in the range of 3–6 V showed no impact on the amplitude of change on the polarization under mechanical stress. Mechanical stress also did not show significant impact on the coercive field.

Bibliography

LÃ¼, X., Zhu, J., Li, X., Zhang, Z., Zhang, X., Wu, D., Yan, F., Ding, Y., & Wang, Y. (2000). Effect of uniaxial stress on the polarization of SrBi2Ta2O9 thin films. Applied Physics Letters, 76(21), 3103â3105.

Authors 9

Xiaomei Lü (first)
Jinsong Zhu (additional)
Xuelian Li (additional)
Zhigang Zhang (additional)
Xuesong Zhang (additional)
Di Wu (additional)
Fen Yan (additional)
Yong Ding (additional)
Yening Wang (additional)

References 13 Referenced 23

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10.1557/PROC-493-81 / Mater. Res. Soc. Symp. Proc. (1997)
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Dates

Type	When
Created	23 years, 1 month ago (July 26, 2002, 9:29 a.m.)
Deposited	1 year, 7 months ago (Feb. 3, 2024, 1:07 p.m.)
Indexed	1 year, 6 months ago (Feb. 7, 2024, 8:21 p.m.)
Issued	25 years, 3 months ago (May 22, 2000)
Published	25 years, 3 months ago (May 22, 2000)
Published Print	25 years, 3 months ago (May 22, 2000)

Funders 0

None

BibTeX

@article{L__2000, title={Effect of uniaxial stress on the polarization of SrBi2Ta2O9 thin films}, volume={76}, ISSN={1077-3118}, url={http://dx.doi.org/10.1063/1.126537}, DOI={10.1063/1.126537}, number={21}, journal={Applied Physics Letters}, publisher={AIP Publishing}, author={Lü, Xiaomei and Zhu, Jinsong and Li, Xuelian and Zhang, Zhigang and Zhang, Xuesong and Wu, Di and Yan, Fen and Ding, Yong and Wang, Yening}, year={2000}, month=may, pages={3103–3105} }

JSON

{
  "indexed": {
    "date-parts": [
      [
        2024,
        2,
        8
      ]
    ],
    "date-time": "2024-02-08T01:21:17Z",
    "timestamp": 1707355277563
  },
  "reference-count": 13,
  "publisher": "AIP Publishing",
  "issue": "21",
  "content-domain": {
    "domain": [
      "pubs.aip.org"
    ],
    "crossmark-restriction": true
  },
  "published-print": {
    "date-parts": [
      [
        2000,
        5,
        22
      ]
    ]
  },
  "abstract": "<jats:p>The effect of uniaxial stress on the ferroelectric properties of SrBi2Ta2O9 films with different thicknesses (330, 440, and 660 nm) has been investigated. It is found that both the remnant polarization (Pr) and the spontaneous polarization (Ps) decrease with the application of compressive stress, but increase with the application of tensile stress. And the changes of Pr and Ps become larger for thicker films. For the 660 nm film, as the stress changed from \u2212100 MPa (compressive) to +100 MPa (tensile), the Pr increases from \u22121.8% to +1.8%. Testing voltages in the range of 3\u20136 V showed no impact on the amplitude of change on the polarization under mechanical stress. Mechanical stress also did not show significant impact on the coercive field.</jats:p>",
  "DOI": "10.1063/1.126537",
  "type": "journal-article",
  "created": {
    "date-parts": [
      [
        2002,
        7,
        26
      ]
    ],
    "date-time": "2002-07-26T13:29:07Z",
    "timestamp": 1027690147000
  },
  "page": "3103-3105",
  "update-policy": "http://dx.doi.org/10.1063/aip-crossmark-policy-page",
  "source": "Crossref",
  "is-referenced-by-count": 23,
  "title": "Effect of uniaxial stress on the polarization of SrBi2Ta2O9 thin films",
  "prefix": "10.1063",
  "volume": "76",
  "author": [
    {
      "given": "Xiaomei",
      "family": "L\u00fc",
      "sequence": "first",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Jinsong",
      "family": "Zhu",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Xuelian",
      "family": "Li",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Zhigang",
      "family": "Zhang",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Xuesong",
      "family": "Zhang",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Di",
      "family": "Wu",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Fen",
      "family": "Yan",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Yong",
      "family": "Ding",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    },
    {
      "given": "Yening",
      "family": "Wang",
      "sequence": "additional",
      "affiliation": [
        {
          "name": "National Laboratory of Solid State Microstructures, Department of Physics, Nanjing University, Nanjing\u2009210093, People\u2019s Republic of China"
        }
      ]
    }
  ],
  "member": "317",
  "reference": [
    {
      "key": "2024020318071472100_r1",
      "first-page": "22",
      "volume-title": "Phys. Today",
      "year": "1998"
    },
    {
      "key": "2024020318071472100_r2",
      "doi-asserted-by": "crossref",
      "first-page": "5783",
      "DOI": "10.1063/1.346948",
      "volume": "68",
      "year": "1990",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020318071472100_r3",
      "doi-asserted-by": "crossref",
      "first-page": "627",
      "DOI": "10.1038/374627a0",
      "volume": "374",
      "year": "1995",
      "journal-title": "Nature (London)"
    },
    {
      "key": "2024020318071472100_r4",
      "doi-asserted-by": "crossref",
      "first-page": "2981",
      "DOI": "10.1149/1.2220943",
      "volume": "140",
      "year": "1993",
      "journal-title": "J. Electrochem. Soc."
    },
    {
      "key": "2024020318071472100_r5",
      "doi-asserted-by": "crossref",
      "first-page": "1926",
      "DOI": "10.1063/1.360230",
      "volume": "78",
      "year": "1995",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020318071472100_r6",
      "doi-asserted-by": "crossref",
      "first-page": "6449",
      "DOI": "10.1063/1.359118",
      "volume": "77",
      "year": "1995",
      "journal-title": "J. Appl. Phys."
    },
    {
      "key": "2024020318071472100_r7",
      "doi-asserted-by": "crossref",
      "first-page": "363",
      "DOI": "10.1557/PROC-433-363",
      "volume": "433",
      "year": "1996",
      "journal-title": "Mater. Res. Soc. Symp. Proc."
    },
    {
      "key": "2024020318071472100_r8",
      "doi-asserted-by": "crossref",
      "first-page": "608",
      "DOI": "10.1063/1.120820",
      "volume": "72",
      "year": "1998",
      "journal-title": "Appl. Phys. Lett."
    },
    {
      "key": "2024020318071472100_r9"
    },
    {
      "key": "2024020318071472100_r10",
      "doi-asserted-by": "crossref",
      "first-page": "83",
      "DOI": "10.1016/0921-5107(94)01169-9",
      "volume": "32",
      "year": "1995",
      "journal-title": "Mater. Sci. Eng., B"
    },
    {
      "key": "2024020318071472100_r11",
      "first-page": "418",
      "volume": "B48",
      "year": "1992",
      "journal-title": "Acta Crystallogr., Sect. B: Struct. Sci."
    },
    {
      "key": "2024020318071472100_r12",
      "doi-asserted-by": "crossref",
      "first-page": "81",
      "DOI": "10.1557/PROC-493-81",
      "volume": "493",
      "year": "1997",
      "journal-title": "Mater. Res. Soc. Symp. Proc."
    },
    {
      "key": "2024020318071472100_r13",
      "doi-asserted-by": "crossref",
      "first-page": "R14337",
      "DOI": "10.1103/PhysRevB.54.R14337",
      "volume": "54",
      "year": "1996",
      "journal-title": "Phys. Rev. B"
    }
  ],
  "container-title": "Applied Physics Letters",
  "original-title": [],
  "language": "en",
  "link": [
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/76/21/3103/18549547/3103_1_online.pdf",
      "content-type": "application/pdf",
      "content-version": "vor",
      "intended-application": "syndication"
    },
    {
      "URL": "https://pubs.aip.org/aip/apl/article-pdf/76/21/3103/18549547/3103_1_online.pdf",
      "content-type": "unspecified",
      "content-version": "vor",
      "intended-application": "similarity-checking"
    }
  ],
  "deposited": {
    "date-parts": [
      [
        2024,
        2,
        3
      ]
    ],
    "date-time": "2024-02-03T18:07:24Z",
    "timestamp": 1706983644000
  },
  "score": 1,
  "resource": {
    "primary": {
      "URL": "https://pubs.aip.org/apl/article/76/21/3103/112275/Effect-of-uniaxial-stress-on-the-polarization-of"
    }
  },
  "subtitle": [],
  "short-title": [],
  "issued": {
    "date-parts": [
      [
        2000,
        5,
        22
      ]
    ]
  },
  "references-count": 13,
  "journal-issue": {
    "issue": "21",
    "published-print": {
      "date-parts": [
        [
          2000,
          5,
          22
        ]
      ]
    }
  },
  "URL": "http://dx.doi.org/10.1063/1.126537",
  "relation": {},
  "ISSN": [
    "0003-6951",
    "1077-3118"
  ],
  "subject": [],
  "published-other": {
    "date-parts": [
      [
        2000,
        5,
        22
      ]
    ]
  },
  "published": {
    "date-parts": [
      [
        2000,
        5,
        22
      ]
    ]
  }
}